We calculate the thermionic escape times of electrons and holes in InGaAsN and InGaAs quantum wells using the most recent input data. The short thermionic escape time of holes from the InGaAsN quantum well indicates that hole leakage may be a significant factor in the poorer temperature characteristics of InGaAsN quantum-well lasers compared to those of InGaAs devices. We suggest a structure that results in an increased escape time, which will allow the reduction of hole leakage in these devices. © 2003 American Institute of Physics. ͓DOI: 10.1063/1.1558218͔The poor temperature characteristics of 1.3-m, InPbased semiconductor lasers have led to enormous efforts in exploring InGaAsN quantum-well ͑QW͒ lasers, 1-8 as an alternative to realize high-performance QW lasers for hightemperature operation. Early high threshold-current-density (J th ) 1300-nm InGaAsN single-quantum-well ͑SQW͒ lasers exhibit anomalously high T 0 (1/T 0 ϭ(1/J th )dJ th /dT) values, due to the large monomolecular recombination.9,10 Unfortunately, the T 0 values of the high-performance 1300-nm InGaAsN SQW lasers are only 70-110 K, [1][2][3][4][5]8 which is low compared to those of the 1200-nm InGaAs SQW lasers (T 0 ϭ200 K).1 The underlying cause for the relatively low T 0 values for InGaAsN lasers has not been conclusively determined. Recent analysis without taking account of carrier leakage processes, has attributed the low T 0 values to the existence of Auger recombination in the InGaAsN QW.10 In our earlier work, 9 the reduced T 0 andciency͒ values of the 1300-nm InGaAsN QW lasers, compared to 1190-nm InGaAs QW lasers, has been linked to an increase in the carrier/current leakage processes. Despite the deeper QW structure in the InGaAsN QW lasers, the experimentally measured current injection efficiency ( inj ) of 1300-nm InGaAsN QW reduces more rapidly with temperature compared to that of the 1200-nm InGaAs QW lasers. Here, we identify a carrier-leakage process in InGaAsN QW lasers 9 as heavy-hole ͑hh͒ leakage due to poor active-layer hole confinement.The thermionic carrier lifetime ( e ) in QW lasers is an important factor in determining the inj of a laser.11,12 A large thermionic lifetime of the carriers in the QW indicates a minimal escape rate of the carriers from the QW to the separate confinement heterostructure ͑SCH͒.11,12 Minimal thermionic carrier escape rate out of the QW will lead to an increase in inj and a reduction in the temperature sensitivity of inj .11,12 The conventional method to express the thermionic lifetime is based on the model by Schneider et al., 13 which utilizes the bulk ͓three-dimensional ͑3-D͔͒ density of states ͑DOS͒ and a simple parabolic band model. However, this model 13 has been shown to be insufficient to explain experiments, 14 and has a tendency to significantly overestimate the hole lifetime and to underestimate the electron lifetime.14 The thermionic lifetime model that we employ in this study is based on the model proposed by Irikawa et al.,14 that has been applied to the study of 1500-nm InGa͑Al͒A...