The development of a XEOL and TR XEOL detection system for the I18 microfocus beamline Diamond light source

Taylor, Richard; Finch, A.; Mosselmans, J. Frederick W.; Quinn, Paul D.

doi:10.1016/j.jlumin.2012.09.018

Cited by 11 publications

(11 citation statements)

References 31 publications

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“…The maturing and increasing accessibility of synchrotron radiation capabilities will open up new opportunities for research. On the horizon is micro beam and nano beam imaging using XEOL as a detection technique to investigate functional organic material devices among other systems [54][55][56][57][58][59][60][61]. Timegated spectroscopy, 2D XAS-XEOL spectroscopy and the implementation of an optical streak camera will also enable time-resolved studies and the tracking of the energy and charge transfer processes leading to XEOL more effectively [12,62].…”

Section: Discussionmentioning

confidence: 99%

Soft X-ray excited optical luminescence from functional organic materials

Sham

2015

Journal of Electron Spectroscopy and Related Phenomena

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This brief report reviews some of the recent findings in the study of synchrotron based X-ray Excited Optical Luminescence (XEOL) from representative organic Light Emitting Device (OLED) and related functional organic materials. The systems of interest include Alq 3, aluminum tris(8-hydroxylquinoline); Ru(bipy) 3 2+ , tris-(2,2-bipyridine) ruthenium(II); Ir(bpy) 3 , tris(2phenyl-bipyridine)iridium; PVK (poly(N-vinylcarbazole)) and [Au 2 (dppe)(bipy)] 2+ , a Au(I) polymer containing 1,2-bis(diphenylphosphino)ethane and the 4,40-bipyridyl ligands, as well as TBPe (2,5,8,11-tetra-tert-butylperylene) polyhedral crystals and fluorescein isothiocyanate (FITC) and FITC-labeled proteins. It is shown that tunable and pulsed X-rays from synchrotron light sources enable the detailed tracking of the optical properties of organic functional materials by monitoring the luminescence in both the energy and time domain as the excitation energy is scanned across an element specific absorption edge. The use of XEOL and X-ray absorption spectroscopy (XAS) in materials analysis is illustrated.

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Section: Discussionmentioning

confidence: 99%

Soft X-ray excited optical luminescence from functional organic materials

Sham

2015

Journal of Electron Spectroscopy and Related Phenomena

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“…X-ray excited optical luminescence (XEOL) 1−5 is a potentially rich source of information on the chemistry, local atomic order, and electronic structure of a surface. Because the emission concerned lies in the wave bands from the near UV to the near IR, a detector based on more or less conventional light optics can be used.…”

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confidence: 99%

Real Time Observation of X-ray-Induced Surface Modification Using Simultaneous XANES and XEOL-XANES

et al. 2013

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In experiments preliminary to the design of an X-ray-excited optical luminescence (XEOL)-based chemical mapping tool we have used X-ray micro (4.5 × 5.2 μm) and macro (1 × 6 mm) beams with similar total fluxes to assess the effects of a high flux density beam of X-rays at energies close to an absorption edge on inorganic surfaces in air. The near surface composition of corroded cupreous alloys was analyzed using parallel X-ray and optical photoemission channels to collect X-ray absorption near-edge structure (XANES) data at the Cu K edge. The X-ray fluorescence channel is characteristic of the composition averages over several micrometers into the surface, whereas the optical channel is surface specific to about 200 nm. While the X-ray fluorescence data were mostly insensitive to the X-ray dose, the XEOL-XANES data from the microbeam showed significant dose-dependent changes to the superficial region, including surface cleaning, changes in the oxidation state of the copper, and destruction of surface compounds responsible for pre-edge fluorescence or phosphorescence in the visible. In one case, there was evidence that the lead phase in a bronze had melted. Conversely, data from the macrobeam were stable over several hours. Apart from localized heating effects, the microbeam damage is probably associated with the O3 loading of the surface and increased reaction rate with atmospheric water vapor.

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“…(1) The state of the solar cell prohibits the simultaneous measurement of XBIC (short circuit) and XBIV (open circuit) measurements. As XEOL 48,49 measures the radiative recombination of electron-hole pairs, a measured current of the solar cell (XBIC) would be a competitive process. Therefore, XEOL measurements are typically conducted under open-circuit condition, which is compatible with simultaneous XBIV measurements.…”

Section: (D) Multi-modal Measurementsmentioning

confidence: 99%

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Ossig

Nietzold

West

et al. 2019

JoVE

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X-ray beam induced current (XBIC) measurements allow mapping of the nanoscale performance of electronic devices such as solar cells. Ideally, XBIC is employed simultaneously with other techniques within a multi-modal X-ray microscopy approach. An example is given herein combining XBIC with X-ray fluorescence to enable point-by-point correlations of the electrical performance with chemical composition. For the highest signal-to-noise ratio in XBIC measurements, lock-in amplification plays a crucial role. By this approach, the X-ray beam is modulated by an optical chopper upstream of the sample. The modulated X-ray beam induced electrical signal is amplified and demodulated to the chopper frequency using a lock-in amplifier. By optimizing low-pass filter settings, modulation frequency, and amplification amplitudes, noise can efficiently be suppressed for the extraction of a clear XBIC signal. A similar setup can be used to measure the X-ray beam induced voltage (XBIV). Beyond standard XBIC/XBIV measurements, XBIC can be measured with bias light or bias voltage applied such that outdoor working conditions of solar cells can be reproduced during in-situ and operando measurements. Ultimately, the multi-modal and multi-dimensional evaluation of electronic devices at the nanoscale enables new insights into the complex dependencies between composition, structure, and performance, which is an important step towards solving the materials' paradigm.

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The development of a XEOL and TR XEOL detection system for the I18 microfocus beamline Diamond light source

Cited by 11 publications

References 31 publications

Soft X-ray excited optical luminescence from functional organic materials

Soft X-ray excited optical luminescence from functional organic materials

Real Time Observation of X-ray-Induced Surface Modification Using Simultaneous XANES and XEOL-XANES

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

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