The determination of molybdenum and tungsten in solutions by thin-film X-ray-fluorescence spectrometry

Eddy, B.T.; Balaes, A. M. E.

doi:10.1016/0584-8547(85)80055-0

Cited by 7 publications

(1 citation statement)

References 6 publications

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“…The accuracy and precision has been claimed to be as good as that of classical chemical methods. A method using XRF for the determination of W after separation on an ion exchange resin is described by Eddy and Balaes (1985). The dried resin is milled with sand, binder and internal standard mixture of Nb and Zn.…”

Section: X-ray Fluorescence Spectrometrymentioning

confidence: 99%

Analysis of tungsten in low grade ores and geological samples

et al. 1996

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Abslract. The determination of tungsten in low grade ores and geological samples is one of the most difficult and challenging tasks. Many of the associated elements, especially molybdenum interfere. These have to be overcome by suitable methods of separation or suppression of the interfering elements. Since the concentrations are low, instrumental methods are preferred over the classical methods. Thus spectrophotometry, fluorometry, atomic absorption spectrometry, atomic emission spectrometry, X-ray fluorescence, neutron activation analysis, electro analytical methods and chromatography are preferred. These are discussed in this review.

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Section: X-ray Fluorescence Spectrometrymentioning

confidence: 99%

Analysis of tungsten in low grade ores and geological samples

et al. 1996

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Determination of some trace elements in high‐purity tantalum metal by thin‐film x‐ray fluorescence spectrometry

Eddy

Balaes

1988

X-Ray Spectrometry

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The determination of niobium, molybdenum, tungsten, iron and titanium in tantalum metal is described. After dissolution of the metal a d extraction of the tantalum by a chromatographic method using tributyl phosphate, the trace elements are determined on thin-film samples by x-ray fluorescence spectrometry. The thin-film samples are prepared either by spotting the sample solutions directly on to filter-paper or by coprecipitation with indium. The limits of detection on the thin film are 0.05-0.7 pg, depending on the element being measured.

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