The degradation of multi-crystalline silicon solar cells after damp heat tests

Oh, Wonwook; Kim, Seongtak; Bae, Soohyun; Park, Nochang; Lee, Hae Seok; Kim, Dong Hwan

doi:10.1016/j.microrel.2014.07.071

Cited by 27 publications

(10 citation statements)

References 15 publications

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“…For the power loss caused by the hygrothermal stress in c-Si PV modules, several reports have shown that the increase in R S in finger grids on Si wafer is the main failure mode, [30][31][32][33] which is due to the corrosion under the acidic condition caused primarily by the acetate ions liberated from EVA at high temperature and humidity. This corrosion would induce the delamination between the Si wafer and the finger grids or the deposition of silver oxide in the interface.…”

Section: Discussionmentioning

confidence: 99%

“…This corrosion would induce the delamination between the Si wafer and the finger grids or the deposition of silver oxide in the interface. 30,31,33,34) However, we have not yet determined which pathway is the underlying mechanism during the hygrothermal test. It is confirmed from the dark I-V characteristics that R S is increased by all the hygrothermal stresses (DH stress test, HAST, and air-HAST).…”

Section: Discussionmentioning

confidence: 99%

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Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

Suzuki¹,

Tanahashi

Doi

et al. 2016

Jpn. J. Appl. Phys.

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We examined the effects of hyper-hygrothermal stresses with or without air on the degradation of crystalline silicon (c-Si) photovoltaic (PV) modules, to shorten the required duration of a conventional hygrothermal-stress test [i.e., the "damp heat (DH) stress test", which is conducted at 85°C/85% relative humidity for 1,000 h]. Interestingly, the encapsulant within a PV module becomes discolored under the air-included hygrothermal conditions achieved using DH stress test equipment and an air-included highly accelerated stress test (air-HAST) apparatus, but not under the air-excluded hygrothermal conditions realized using a highly accelerated stress test (HAST) machine. In contrast, the reduction in the output power of the PV module is accelerated irrespective of air inclusion in hyper-hygrothermal test atmosphere. From these findings, we conclude that the required duration of the DH stress test will at least be significantly shortened using air-HAST, but not HAST.

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Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

Suzuki¹,

Tanahashi

Doi

et al. 2016

Jpn. J. Appl. Phys.

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“…7 And the cause of the increase in the series is because the sliver ngers and solder joints could be oxidized or corroded by high thermal and moisture stress. [8][9][10] As seen in Table S2, † the P max of traditional backsheet PV modules keep going down as aging continued. In contrast, double glass modules remain relatively constant under the same level of exposures.…”

Section: Damp Heatmentioning

confidence: 99%

Long-term reliability of silicon wafer-based traditional backsheet modules and double glass modules

Zhang

Xu²,

Mao³

et al. 2015

RSC Adv.

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An extensive program of series extended sequential long-term reliability stress including thermal cycling (TC) 600, damp heat (DH) 3000, 600 hours potential induced degradation (PID) and humidity freeze (HF) 50 were performed on silicon wafer-based traditional backsheet modules and double glass photovoltaic (PV) modules. The relative module maximum power (P max ) degradations of traditional backsheet modules are 3.87%, 7.34%, 13.3%, 33.73% and those of double glass modules are 2.78%, 3.12%, 2.27%, 2.72%, respectively. From all the above results, HF50 has a greater impact on P max degradation of traditional backsheet modules, and a strong correlation is thereby found between the Water Vapor Transmission Rate (WVTR) of the backsheet and the P max degradation. Traditional backsheet modules have higher WVTR and greater P max degradation, while double glass modules are impermeable and have much lower P max degradation. The key factor for excellent performance of Si wafer-based double glass PV modules is replacing the polymer backsheet by a glass panel with impermeability to water vapor, which enables double glass modules to offer much higher reliability and longer durability.

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“…5) Thus, the corrosion of the Ag finger electrodes, which increases the series resistance of the modules, is one of the predominant degradation processes of crystalline Si PV modules. AcOH is also formed in the modules after a long-term damp-heat (DH) test under high temperature and humidity, [4][5][6][7][8][9][10][11][12][13][14][15] which is one of the indoor accelerated stress tests for PV modules, leading to the corrosion of the Ag finger electrodes [the formation of Pb(CH 3 COO) 2 ]. 9,10) In addition, potential-induced degradation (PID) in crystalline Si PV modules has been recently observed in PV systems where many PV modules are serially interconnected, resulting in significant power losses.…”

Section: Introductionmentioning

confidence: 99%

Durable crystalline Si photovoltaic modules based on silicone-sheet encapsulants

Hara

Ohwada

Furihata

et al. 2018

Jpn. J. Appl. Phys.

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Crystalline Si photovoltaic (PV) modules were fabricated with sheets of poly(dimethylsiloxane) (silicone) as an encapsulant. The long-term durability of the silicone-encapsulated PV modules was experimentally investigated. The silicone-based modules enhanced the long-term durability against potential-induced degradation (PID) and a damp-heat (DH) condition at 85 °C with 85% relative humidity (RH). In addition, we designed and fabricated substrate-type Si PV modules based on the silicone encapsulant and an Al-alloy plate as the substratum, which demonstrated high impact resistance and high incombustible performance. The high chemical stability, high volume resistivity, rubber-like elasticity, and incombustibility of the silicone encapsulant resulted in the high durability of the modules. Our results indicate that silicone is an attractive encapsulation material, as it improves the long-term durability of crystalline Si PV modules.

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The degradation of multi-crystalline silicon solar cells after damp heat tests

Cited by 27 publications

References 15 publications

Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

Acceleration of degradation by highly accelerated stress test and air-included highly accelerated stress test in crystalline silicon photovoltaic modules

Long-term reliability of silicon wafer-based traditional backsheet modules and double glass modules

Durable crystalline Si photovoltaic modules based on silicone-sheet encapsulants

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