“…This is in agreement with Ref. [13] and the original observation of the glass skin [14] which led to a theory indicating that nucleation may actually occur a few nm below the glass surface [14].…”
Section: Reproduction On the Gm 30870 Meltsupporting
confidence: 92%
“…[7][8][9][10]. The recent application of electron backscatter diffraction (EBSD) to the surface crystallization of cordierite [11,12] has confirmed some previous results such as statistical crystal nucleation at the surface and a glass skin covering these topmost crystals [13,14]. Some new insights into local orientations and orientation development during growth were also provided.…”
Section: Introductionmentioning
confidence: 55%
“…solid, homogeneous growth of a single layer of crystals into the bulk. The method of EBSD-pattern degradation [13] was also applied and showed a discrepancy in the minimal step size with which unpolished crystals at the surface and polished crystals in cross sections could be scanned, i.e. there is a glass skin covering the crystals at the immediate surface.…”
Section: Reproduction On the Gm 30870 Meltmentioning
confidence: 99%
“…2b) as well as the grain boundaries show a higher contrast. It may be concluded that the glass layer covering the crystals [13,14] was removed during etching. Both surfaces show a large number of crystals above the cordierite crystals, mainly following the grain boundaries of the underlying μ-cordierite.…”
“…This is in agreement with Ref. [13] and the original observation of the glass skin [14] which led to a theory indicating that nucleation may actually occur a few nm below the glass surface [14].…”
Section: Reproduction On the Gm 30870 Meltsupporting
confidence: 92%
“…[7][8][9][10]. The recent application of electron backscatter diffraction (EBSD) to the surface crystallization of cordierite [11,12] has confirmed some previous results such as statistical crystal nucleation at the surface and a glass skin covering these topmost crystals [13,14]. Some new insights into local orientations and orientation development during growth were also provided.…”
Section: Introductionmentioning
confidence: 55%
“…solid, homogeneous growth of a single layer of crystals into the bulk. The method of EBSD-pattern degradation [13] was also applied and showed a discrepancy in the minimal step size with which unpolished crystals at the surface and polished crystals in cross sections could be scanned, i.e. there is a glass skin covering the crystals at the immediate surface.…”
Section: Reproduction On the Gm 30870 Meltmentioning
confidence: 99%
“…2b) as well as the grain boundaries show a higher contrast. It may be concluded that the glass layer covering the crystals [13,14] was removed during etching. Both surfaces show a large number of crystals above the cordierite crystals, mainly following the grain boundaries of the underlying μ-cordierite.…”
“…As the EBSD-scan was performed with a step size of 200 nm, the thermal footprints of the scan step overlap which can lead to increased temperatures in the scan area and even cause EBSD-pattern degradation48. In the case of this scan, a significant increase of the topography contrast was observed after the scan, probably because some of the residual glass at the surface was evaporated.…”
Two glasses of the compositions 2 BaO - TiO2 - 2.75 GeO2 and 2 BaO – TiO2 –3.67 GeO2 (also known as BTG55) are annealed at temperatures from 680 to 970 °C to induce surface crystallization. The resulting samples are analyzed by X-ray diffraction (XRD) and scanning electron microscopy (SEM) including electron backscatter diffraction (EBSD). Ge-Fresnoite (Ba2TiGe2O8, BTG) is observed at the immediate surface of all samples and oriented nucleation is proven in both compositions. After a very fast kinetic selection, the crystal growth of BTG into the bulk occurs via highly oriented dendrites where the c-axes are oriented perpendicular to the surface. The growth of this oriented layer is finally blocked by dendritc BTG originating from bulk nucleation. The secondary phases BaTiGe3O9 (benitoite) and BaGe4O9 are also identified near the surface by XRD and localized by EBSD which additionally indicates orientation preferences for these phases. This behaviour is in contrast with previous reports from the Ba2TiSi2O8 as well as the Sr2TiSi2O8 systems.
This article contains a critical review of the literature concerning the information depth of electron backscatter diffraction (EBSD) and a viewpoint on the topic is formulated. EBSD is applied to a crystal partially covered by a wedge of amorphous glass. EBSD-patterns of decreasing quality are obtained from a crystal covered by an increasingly thick layer of glass. The location of the last indexable EBSD-patterns is compared to the last discernible contrast in SEM-micrographs obtained from the same crystal using accelerating voltages of 2-20 kV. It is concluded that the information depth of EBSD is at least as large as that of an SEM-micrograph obtained with a voltage of 4 kV from a non-tilted sample. Concepts of the information depth and experimental approaches are discussed.
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