The curvature profile measurement using white-light scanning interferometry

Kwon, YongKwan; Heo, EunChang; Kim, ByoungChang

doi:10.1109/iccas.2007.4406739

2007 International Conference on Control, Automation and Systems 2007

DOI: 10.1109/iccas.2007.4406739

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The curvature profile measurement using white-light scanning interferometry

YongKwan Kwon

EunChang Heo

ByoungChang Kim

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The curvature profile measurement using white-light scanning interferometry

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References 11 publications

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