2012
DOI: 10.1088/1742-6596/400/5/052032
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The cryostat for deformation of crystals at low temperatures

Abstract: The cryostat 1 was worked out, helped to deform the crystals at 80 K with different degree of deformation and to register luminescence, absorption and thermally activated characteristics of crystals, also to record the ionic and thermally stimulated currents of the dipole defects of depolarization. The degree of crystals deformation is given by compressing screw pitch which is equal to 1mm at a complete revolution of the crystal holder. The construction of the cryostat allows to set experimentally the desired … Show more

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Cited by 14 publications
(5 citation statements)
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“…The boundary of elastic and plastic deformation is determined experimentally by the linear section of the dependence of the intensity of σ -and E xluminescence on the degree of deformation at which Hooke's law is valid [16]. In this regard, to create only the elastic part of the deformation, the crystals were deformed at low temperature (85 K) within the range of ε = 0.8 − 1.0% in a special cryostat under high technical vacuum conditions [19].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The boundary of elastic and plastic deformation is determined experimentally by the linear section of the dependence of the intensity of σ -and E xluminescence on the degree of deformation at which Hooke's law is valid [16]. In this regard, to create only the elastic part of the deformation, the crystals were deformed at low temperature (85 K) within the range of ε = 0.8 − 1.0% in a special cryostat under high technical vacuum conditions [19].…”
Section: Resultsmentioning
confidence: 99%
“…The multifunctional spectral complex performs scanning of X-ray luminescence, tunnel luminescence (TL) and thermostimulated luminescence spectra (TSL), as well as integrated scanning of TL and TSL crystals using a high-power monochromator MSD-2 and a photoelectronic multiplier of H 8259 type of the company "Hamamatsu", operating in the photon counting mode, controlled by special programs SpectraScan and ThermoScan in a wide spectrum range of 200 ÷ 850 nm and temperatures of 85 ÷ 400 K under the influence of uniaxial deformation ( ε = 0.1 − 1.2% ) under high technical vacuum conditions [19].…”
Section: Experimental Technique and Research Objectsmentioning
confidence: 99%
“…The experimental setup allows scanning in a range of 200-850 nm the spectra of XRL and thermally stimulated luminescence (TSL), as well as measuring of the integral TSL curves of the crystals subjected to the elastic uniaxial deformation at 90 K. The measurements were carried out using an MSD-2 high-aperture monochromator with an H 8259 photomultiplier (Hamamatsu) operating in the photon counting mode and controlled by special programs SpectraScan and ThermoScan. Lowtemperature deformation and recording of the luminescence characteristics of the crystals were carried out using a special cryostat equipped with appropriate windows [39].…”
Section: Methodsmentioning
confidence: 99%
“…Uniaxial deformation (ε = 0.8 ÷ 0.9%) of crystals was carried out along <100> and <110> crystallographic directions in a special cryostat at low temperatures (85 K) under conditions of high technical vacuum (10 −6 ) Torr [29].…”
Section: Objects Of Research and Technique Of Experimentsmentioning
confidence: 99%