The core contribution of transmission electron microscopy to functional nanomaterials engineering

Abstract

Research on nanomaterials and nanostructured materials is burgeoning because their numerous and versatile applications contribute to solve societal needs in the domain of medicine, energy, environment and STICs. Optimizing their properties requires in-depth analysis of their structural, morphological and chemical features at the nanoscale. In a transmission electron microscope (TEM), combining tomography with electron energy loss spectroscopy and high-magnification imaging in high-angle annular dark-field mode provides access to all features of the same object. Today, TEM experiments in three dimensions are paramount to solve tough structural problems associated with nanoscale matter. This approach allowed a thorough morphological description of silica fibers. Moreover, quantitative analysis of the mesoporous network of binary metal oxide prepared by template-assisted spray-drying was performed, and the homogeneity of amino functionalized metal-organic frameworks was assessed. Besides, the morphology and internal structure of metal phosphide nanoparticles was deciphered, providing a milestone for understanding phase segregation at the nanoscale. By extrapolating to larger classes of materials, from soft matter to hard metals and/or ceramics, this approach allows probing small volumes and uncovering materials characteristics and properties at two or three dimensions. Altogether, this feature article aims at providing (nano)materials scientists with a representative set of examples that illustrates the capabilities of modern TEM and tomography, which can be transposed to their own research.

Electron Tomography: A Unique Tool Solving Intricate Hollow Nanostructures

“…[13][14][15] Notably, the knowledge gap between nanomaterial synthesis and application lies the precise characterization of these complicated architectures, which provides vital information on the origin of nanostructure formation as well as the structure-performance relationship. [16,17] However, for some 3D nanostructures especially with intricate geometric features, 2D information derived from either TEM or SEM may hardly represent the genuine configurations due to their intrinsic limitations. [16,17] However, for some 3D nanostructures especially with intricate geometric features, 2D information derived from either TEM or SEM may hardly represent the genuine configurations due to their intrinsic limitations.…”

“…[16,17] However, for some 3D nanostructures especially with intricate geometric features, 2D information derived from either TEM or SEM may hardly represent the genuine configurations due to their intrinsic limitations. [16,17] However, for some 3D nanostructures especially with intricate geometric features, 2D information derived from either TEM or SEM may hardly represent the genuine configurations due to their intrinsic limitations.…”

“…[16] For instance, SEM typically reflects the surface features but fails to visualize the structures hidden inside. [16] For instance, SEM typically reflects the surface features but fails to visualize the structures hidden inside.…”

Transmission electron microscopy analysis of some transition metal compounds for energy storage and conversion

“…With the help of advanced TEM techniques, the origin of the properties of these anode materials encoded in their microstructures can be elucidated. Several review articles covering such subjects have been published [9,[15][16][17][18][19]. To illustrate a property-structure relationship, the importance of obtaining high resolution images and spectra is obvious.…”

Colloidal Magnetic Heterostructured Nanocrystals with Asymmetric Topologies: Seeded-Growth Synthetic Routes and Formation Mechanisms

“…Such study can be carried out by combining state-of-art scanning electron microscopy and transmission electron microscopy (TEM), high-angle annular dark-field imaging in scanning transmission electron microscopy mode (HAADF-STEM), phase-contrast high-resolution transmission electron microscopy (HRTEM), electron diffraction, TEM tomography, and elemental microanalysis techniques available in a TEM microscope (Midgley and Weyland, 2003;Seyring et al, 2011;Ringe, 2014;Ross, 2015;Carenco et al, 2016), with electron and X-ray scattering and diffraction approaches (Ringe, 2014;Ghigna and Spinolo, 2015;Giannini et al, 2016;Li et al, 2016). Indirect, yet complementary, information can be gathered by monitoring the time evolution of the pertinent optical and magnetic properties.…”