2019
DOI: 10.1016/j.optmat.2019.109251
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The comparative studies of HF CVD diamond films by Raman and XPS spectroscopies

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Cited by 33 publications
(17 citation statements)
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“…Hydrogen is believed to saturate non-radiative recombination sites like dangling bonds and, as a result, form centres of radiative recombination. Therefore, m/I G parameter may indicate the concentration of hydrogen in diamond layer [ 29 , 30 , 31 ].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Hydrogen is believed to saturate non-radiative recombination sites like dangling bonds and, as a result, form centres of radiative recombination. Therefore, m/I G parameter may indicate the concentration of hydrogen in diamond layer [ 29 , 30 , 31 ].…”
Section: Resultsmentioning
confidence: 99%
“…Additional information can be also extracted from the photoluminescence PL background of the Raman spectrum, as it has been shown that the slope m of the linearly subtracted PL background normalized to the intensity of G band— m/I G is proportional to the hydrogen concentration in hydrogenated amorphous carbon [ 29 ]. It has also been shown that the PL background of Raman spectra of diamond layers depends on the hydrogen concentration at grain boundaries and on the surface [ 30 , 31 ]. However, density of defects in the diamond layer also influences the PL background behaviour and possible changes in m/I G parameter might be very small; therefore, data interpretation must be performed with caution.…”
Section: Introductionmentioning
confidence: 99%
“…To ascertain the surface structure, the ratio of sp 2 to sp 3 intensities were calculated. sp 2 :sp 3 ratio for 30/70 and 50/50 samples were 1.32 and 2.15, respectively, as determined using the method outlined by Paprocki et al [i.e., sp 2 /sp 3 = A sp 2 /A sp 3 ]. This showed that the both composite samples (30/70 and 50/50) contain a high sp 2 component, which increases with increased diamond powder.…”
Section: Resultsmentioning
confidence: 99%
“…XPS, as an effective technique, is applied to analyze the surface elements and functional groups [ 36 ]. Figure 2 b shows the wide-scan survey XPS spectra of CF, CF-KH550 and CF-SiO 2 –2.…”
Section: Resultsmentioning
confidence: 99%