The Coherence Description of the Dynamical X‐Ray Diffraction from Randomly Disordered Crystals II. Some Numerical Results

Holý, V.

doi:10.1002/pssb.2221120118

Cited by 39 publications

(1 citation statement)

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“…At the same time, Holý proposed another variant of dynamical theory based on the optical coherence formalism [25][26][27][28] and applied this approach for determining the parameters of the single crystals' microdefects [29][30][31]. In addition, the distorted wave Born approximation was used for calculation of scattering patterns for the case when the microdefects are contained in the thin crystalline layers [32].…”

Section: Introductionmentioning

confidence: 99%

X-Ray Dynamical Diffraction by Quasi-Monolayer Graphene

Skakunova

Olikhovskii

Radchenko

et al. 2023

Preprint

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We study the processes of dynamical diffraction on the graphene film/SiC substrate system. The statistical dynamical theory of X-ray diffraction in imperfect crystals is extended to the case of real quasi-two-dimensional systems. The necessity of the taking into account of the variability of the lattice parameter of multilayer graphene, as well as the influence of thickness on the thermal Debye–Waller factor at the calculation of the complex structural factors and Fourier components of polarizability, is demonstrated. It is shown that the change of the structural characteristics of the 3-layer graphene/substrate system, as well as its deformed state, leads to a significant change in the diffraction profiles, which makes it possible to determine the characteristics by the X-ray diffraction method.

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Section: Introductionmentioning

confidence: 99%

X-Ray Dynamical Diffraction by Quasi-Monolayer Graphene

Skakunova

Olikhovskii

Radchenko

et al. 2023

Preprint

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Coherence description of a double crystal diffractometer

Janáček¹

1985

phys. stat. sol. (a)

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The dynamical X‐ray diffraction from an elastically bent crystal is considered using the formalism of mutual coherence functions (MCF). Special attention is paid to the description of a double crystal diffractometer with one elastically bent crystal. General formulae for the MCF and the intensity of the diffracted beam are derived for the case of an arbitrary primary beam. Two types of experimental arrangements are considered under various coherence conditions. The possibility of measuring the reflection curve and the angular distribution of intensity in the diffracted beam is discussed. The formulae suitable for numerical calculations are derived in the approximation of large deformations.

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X-Ray Diffraction from Multilayer Structures with Statistically Distributed Microdefects

Пунегов¹

1993

Phys. Stat. Sol. (a)

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The statistical dynamical theory of X‐ray diffraction is applied to the analysis of simulated rocking curves (RCs) from multilayer systems with randomly distributed microdefects. Recursion formulae for calculating RCs in the general case of multiple diffraction on multilayer crystals are obtained for the Bragg‐Bragg and Laue‐Laue cases. The behaviour of coherently and incoherently scattered intensities for epitaxial films, heterostructures, and superlattices is discussed. It is shown that the alternation of the perfect and imperfect layers of the superlattice leads to the increase of the coherently scattered intensity of satellite peaks.

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The Coherence Description of the Dynamical X‐Ray Diffraction from Randomly Disordered Crystals II. Some Numerical Results

Cited by 39 publications

References 6 publications

X-Ray Dynamical Diffraction by Quasi-Monolayer Graphene

X-Ray Dynamical Diffraction by Quasi-Monolayer Graphene

Coherence description of a double crystal diffractometer

X-Ray Diffraction from Multilayer Structures with Statistically Distributed Microdefects

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