The CIS115: a CMOS sensor qualified for optical imaging in the Jovian environment (Conference Presentation)

Soman, Matthew R.; Allanwood, E. A. H.; Lofthouse-Smith, Daniel-Dee; Holland, Andrew D.; Stefanov, Konstantin D.; Leese, M. R.; Turner, Peter S.

doi:10.1117/12.2309799

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“…3 The radiation qualification of the sensor was carried out at the Open University's CEI, where CIS115 devices were characterised both before and after being subjected to ionising and non-ionising sources of radiation. 4 The impact of radiation on opto-electronic properties has been studied extensively using these data, including effects on image lag 5 and dark current 3 that have been reported previously.…”

Section: Introduction 11 Backgroundmentioning

confidence: 97%

Quantum efficiency of the CIS115 in a radiation environment

Crews

Soman

Allanwood

et al. 2020

X-Ray, Optical, and Infrared Detectors for Astronomy IX

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An optical bench setup for quantum efficiency (QE) measurements across the 350 nm to 1100 nm range has been developed at the Open University's Centre for Electronic Imaging (CEI). Here we use it to measure the performance of a monolithic silicon CMOS image sensor (CIS), the CIS115. This sensor was selected for the JANUS camera, due to launch on board ESA's JUpiter ICy moons Explorer (JUICE) spacecraft in 2022. The CIS115 sensors tested here have high quantum efficiency (QE) over the optical band, due to their backside illumination and multi-layer anti-reflective coating.Here we validate the QE measurements against manufacturer reported performance and compare the QE for unirradiated (beginning of life) and gamma-irradiated devices, indicating that no significant change in performance should be expected after a total ionizing dose (TID) of 200 krad(Si). This is important for the JANUS application, where the sensor is predicted to accumulate up to 44 krad(Si) TID. We also demonstrate that the measurement setup has excellent repeatability.We conclude by discussing the limitations of the setup, including the key systematic error sources that have been understood and investigated. Optional improvement to the setup for reducing these errors are presented and will be considered for follow-on activities.

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Section: Introduction 11 Backgroundmentioning

confidence: 97%