The CIBH Diode - Great Improvement for Ruggedness and Softness of High Voltage Diodes

Felsl, Hans Peter; Pfaffenlehner, M.; Schulze, Holger; Biermann, J.; Gutt, Thomas; Schulze, Hans‐Joachim; Chen, M.; Lutz, Josef

doi:10.1109/ispsd.2008.4538926

Cited by 26 publications

(8 citation statements)

References 3 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A new design procedure of freewheeling diodes based on measurement and simulation is also proposed to improve the reverse recovery softness [24]. Controlled Injection of Backside Holes (CIBH) diodes are also proposed to increase the soft reverse recovery behavior [25]. However, it is still a critical point to avoid snappy recovery when designing freewheeling diodes.…”

Section: Snappy Recoverymentioning

confidence: 99%

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Blaabjerg

Wang

et al. 2013

Microelectronics Reliability

View full text Add to dashboard Cite

Emerging applications (e.g. electric vehicles, renewable energy systems, more electric aircrafts, etc.) have brought more stringent reliability constrains into power electronic products because of safety requirements and maintenance cost issues. To improve the reliability of power electronics, better understanding of failure modes and failure mechanisms of reliability-critical components in power electronic circuits are needed. Many efforts have been devoted to the reduction of IGBT failures, while the study on the failures of freewheeling diodes is less impressive. It is of importance to investigate the catastrophic failures of freewheeling diodes as they could induce the malfunction of other components and eventually the whole power electronic circuits. This paper presents an overview of those catastrophic failures and gives examples of the corresponding consequences to the circuits.

show abstract

Section: Snappy Recoverymentioning

confidence: 99%

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Blaabjerg

Wang

et al. 2013

Microelectronics Reliability

View full text Add to dashboard Cite

show abstract

“…Therefore the reverse voltage rises slowly in the initial stage of the establishment of space charge region. Under such extreme commutation condition, the diode shows the behavior of switching self clamping mode (SSCM) [27] during reverse recovery.…”

Section: Results and Analysesmentioning

confidence: 99%

Destruction behavior in high voltage diode with the field limiting ring termination

Zhang

Wang

Yang

2019

IEICE Electron. Express

View full text Add to dashboard Cite

The turn-off of high voltage diode under over-stress condition may lead to the diode destruction, which appears at the edge of termination or in the active region. The diode destruction behaviors related to current filament, electric field and maximum temperature are investigated by electrothermal simulation. The results show that the electric field punch-through to the termination surface is unavoidable. The disappearance of current filament at the edge of termination should be a self-stabilizing mechanism because of the extraction of carriers. The reasons for leading to the diode destruction at the edge of termination or in the active region are found.

show abstract

“…Also for the turn‐off from very low current densities (e.g. 1/10 of the rated current density), the CIBH concept can help to gain a soft switching behaviour, described in [10].…”

Section: Simulation Resultsmentioning

confidence: 99%

Switching ruggedness and surge‐current capability of diodes using the self‐adjusting p emitter efficiency diode concept

Basler

Pfaffenlehner

Felsl

et al. 2014

IET Circuits, Devices & Systems

View full text Add to dashboard Cite

The surge-current ruggedness of freewheeling diodes can be improved by implementing the self-adjusting p emitter efficiency diode concept (SPEED). Simulations indicate that the switching ruggedness is reduced because of the occurrence of cathode-side filaments during reverse-recovery. Experiments confirm the weak switching performance of such a diode in comparison to a conventional diode. By implementing the controlled injection of backside holes concept cathode-side filaments can be suppressed. However, this measure is not sufficient to regain the switching ruggedness of a conventional diode. It is also necessary to fully embed the p +-areas of the SPEED anode in the low-doped p-type area to avoid high electrical field strengths at the p + p-junction and pinning of anode-side filaments. However, anode-side adjustments for improving the switching ruggedness can reduce the benefit of the SPEED concept regarding the surge-current capability.

show abstract

The CIBH Diode - Great Improvement for Ruggedness and Softness of High Voltage Diodes

Cited by 26 publications

References 3 publications

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Destruction behavior in high voltage diode with the field limiting ring termination

Switching ruggedness and surge‐current capability of diodes using the self‐adjusting p emitter efficiency diode concept

Contact Info

Product

Resources

About