The chemical state vector: a new concept for the characterization of oxide interfaces

Barranco, Ángel; Yubero, F.; Espinós, J. P.; González‐Elipe, Agustín R.

doi:10.1002/sia.1107

Cited by 14 publications

(12 citation statements)

References 26 publications

(17 reference statements)

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“…The silicon Auger parameter, which is defined as the sum of the Si 2p binding energy and the Si KLL kinetic energy of the sample under investigation is a better indicator of the chemical identity, because it is insensitive to charging and other experimental artifacts. [34][35][36] In the case of the gold (core)-silica (shell) nanoclusters, the Auger parameter of the silicon atom was determined to be 1711.8 eV, which is very close to that of the silicon oxide layer as given in Table 1.…”

Section: Resultsmentioning

confidence: 95%

XPS Characterization of Au (Core)/SiO₂ (Shell) Nanoparticles

Tunç¹,

Süzer²,

Correa‐Duarte³

et al. 2005

J. Phys. Chem. B

100

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Core-shell nanoparticles with ca. 15-nm gold core and 6-nm silica shell were prepared and characterized by XPS. The Au/Si atomic ratio determined by XPS is independent of the electron takeoff angle because of the concentric spherical shape of the nanoparticles. The formula given by Wertheim and DiCenzo (Phys. ReV. B 1988, 37, 844) for spherical nanoparticles and the modified one by Yang et. al. (J. Appl. Phys. 2005, 97, 024303) for core-shell nanoparticles are used to correlate the XPS-derived composition with the geometry of the nanoparticles only after significantly modifying either the bulk density of the silica shell or the attenuation length of the photoelectrons.

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Section: Resultsmentioning

confidence: 95%

XPS Characterization of Au (Core)/SiO₂ (Shell) Nanoparticles

Tunç¹,

Süzer²,

Correa‐Duarte³

et al. 2005

J. Phys. Chem. B

100

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“…8,9 An important issue in the semiconductor or oxide-oxide systems is the sharpness of the interface and the presence of suboxides of well-defined stoichiometry. The growth of SiO 2 films on TiO 2 has been studied by Barranco et al 10 , concluding that for low coverages (θ) SiO 2 grows in a layer by layer mode. Finally, the inverse system, i.e.…”

Section: Introductionmentioning

confidence: 99%

Characterization of thin silicon overlayers on rutileTiO2(110)−(1×1)

et al. 2010

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“…These electronic changes have been explained by initial and final state screening effects as a function of the oxide cluster size and their interaction with the atoms in the support. Recently, a new concept, which has been called “chemical state vector”, has been introduced for the characterization of oxide interfaces.…”

Section: Introductionmentioning

confidence: 99%

Interface Effects for Cu, CuO, and Cu₂O Deposited on SiO₂ and ZrO₂. XPS Determination of the Valence State of Copper in Cu/SiO₂ and Cu/ZrO₂ Catalysts

et al. 2002

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Copper and copper oxides (Cu2O and CuO) have been deposited by evaporation of copper and subsequent oxidizing treatments, on the surface of flat SiO2 and ZrO2 substrates. Large variations of several eVs have been found in the values of the Cu 2p3/2 binding energy (BE) and Auger parameter (α‘) of copper as a function of the amount of deposited metallic copper or copper oxides. The magnitude of the changes was also dependent on the type of support upon which the experiment was carried out. These changes have been attributed to modifications in the factors contributing to the initial and final state effects of the process, according to the dispersion degree and the nature of the interactions between the copper oxide moieties and the support. All of these changes can be systematized with the help of chemical state plots. Experiments carried out with real catalysts stress the need of such plots, which summarize the results obtained with the model systems, for a proper characterization of the supported oxide phases in this kind of real materials.

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The chemical state vector: a new concept for the characterization of oxide interfaces

Cited by 14 publications

References 26 publications

XPS Characterization of Au (Core)/SiO₂ (Shell) Nanoparticles

XPS Characterization of Au (Core)/SiO₂ (Shell) Nanoparticles

Characterization of thin silicon overlayers on rutileTiO2(110)−(1×1)

Interface Effects for Cu, CuO, and Cu₂O Deposited on SiO₂ and ZrO₂. XPS Determination of the Valence State of Copper in Cu/SiO₂ and Cu/ZrO₂ Catalysts

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The chemical state vector: a new concept for the characterization of oxide interfaces

Cited by 14 publications

References 26 publications

XPS Characterization of Au (Core)/SiO2 (Shell) Nanoparticles

XPS Characterization of Au (Core)/SiO2 (Shell) Nanoparticles

Characterization of thin silicon overlayers on rutileTiO2(110)−(1×1)

Interface Effects for Cu, CuO, and Cu2O Deposited on SiO2 and ZrO2. XPS Determination of the Valence State of Copper in Cu/SiO2 and Cu/ZrO2 Catalysts

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Product

Resources

About

XPS Characterization of Au (Core)/SiO₂ (Shell) Nanoparticles

XPS Characterization of Au (Core)/SiO₂ (Shell) Nanoparticles

Interface Effects for Cu, CuO, and Cu₂O Deposited on SiO₂ and ZrO₂. XPS Determination of the Valence State of Copper in Cu/SiO₂ and Cu/ZrO₂ Catalysts