The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy

Pei, Tao; Xue, Yifan; Wang, Caihui; Wei, Guoliang; Wen, Huanfei; Tang, Jun; Liu, Jun

doi:10.1109/icemi59194.2023.10270446

2023 IEEE 16th International Conference on Electronic Measurement &Amp; Instruments (ICEMI) 2023

DOI: 10.1109/icemi59194.2023.10270446

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The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy

Tao Pei,

Yifan Xue,

Caihui Wang

et al.

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The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy

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References 21 publications

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