2021
DOI: 10.13052/jrss0974-8024.14116
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The Beta Reduced Modified Weibull Distribution with Applications to Reliability Data

Abstract: [1] C.D. Lai, M. Xie and D.N.P. Murthy. A modified Weibull distribution. EEE Transactions on Reliability, 52(1):33-37, 2003. [2] M. Bebbington, C.D. Lai, and R. Zitikis. A flexible Weibull extension. Reliability Engineering and System Safety, 92:719-726, 2007. [3] A.M. Sarhan and J. Apaloo. Exponentiated modified weibull extension distribution. Reliability Engineering and System Safety, 112:137-144, 2013. [4] F. Famoye, C. Lee and O. Olumolade. The beta-Weibull distribution. Journal of Statis… Show more

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Cited by 2 publications
(1 citation statement)
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“…The first data set is given by Aarset (1987) and represents the time to first failure of 50 devices (in weeks). This data set is: 0.1, 0.2, 1, 1, 1, 1, 1, 2, 3,6,7,11,12,18,18,18,18,18,21,32,36,40,45,46,47,50,55,60,63,63,67,67,67,67,72,75,79,82,82,83,84,84,84,85,85,85,85,85,86,86. The TTT-plot of this data set, in Figure 3(a), shows a convex shape followed by a concave shape.…”
Section: First Data Set: Devices Failure Time Datamentioning
confidence: 99%
“…The first data set is given by Aarset (1987) and represents the time to first failure of 50 devices (in weeks). This data set is: 0.1, 0.2, 1, 1, 1, 1, 1, 2, 3,6,7,11,12,18,18,18,18,18,21,32,36,40,45,46,47,50,55,60,63,63,67,67,67,67,72,75,79,82,82,83,84,84,84,85,85,85,85,85,86,86. The TTT-plot of this data set, in Figure 3(a), shows a convex shape followed by a concave shape.…”
Section: First Data Set: Devices Failure Time Datamentioning
confidence: 99%