The Art of SPM: Scanning Probe Microscopy in Materials Science

Abstract

In this Progress Report, outstanding scientific applications of scanning probe microscopy (SPM) in the field of materials science and the latest technique developments are introduced and discussed. Besides being able to image the organization of matter with sub‐nanometer resolution, SPM, owing to its basic operating principle, provides the power to measure, analyze, and even quantify properties of matter on the nanometer length scale. Moreover, because of its unique potential to manipulate the organization of atoms, molecules, assemblies, or particles and to structure surfaces in a controlled fashion, in the fields of nanoscience and nanotechnology SPM has become one of the most powerful tools for preparation and analysis of nanostructures and their functionality. Because of the tremendous variety of its applications, only selected—but subjectively exceptional—topics are considered in this Progress Report, showing the full potential of SPM.

Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface

“…Therefore, a development of a new test solutions is desired in order to reduce the process expenses as well as to reduce the time of a new product tests and release. In particular, high sensitivity and high resolution measurement techniques, such as atomic force microscopy [1], optical profilometry [2,3] and X-ray microcomputer tomography (CT) [4,5] can be successfully used for determination of the material deterioration. Such methods can provide the information about the decomposition of the material after applying of smaller doses of certain medium than in case of standard tests.…”

“…It should be emphasized that the diversity of atomic force microscopy techniques (AFM) allows one to perform imaging of mechanical, magnetic, electrical, thermal and optical properties of the surface [1]. A number of observations of the morphology change due to the light/temperature or electrical field [6][7][8][9][10] have been performed.…”

Imaging the real shape of nanoclusters in scanning force microscopy

“…In order to locate the nanoclusters on the surface and to determine the cluster's size, shape, and internal structure, scanning probe microscopy ͑SPM͒ is used in most cases. [5][6][7] In particular, scanning force microscopy ͑SFM͒ is applied as soon as nanoclusters are supported on surfaces of insulating oxides such as magnesium oxide or aluminum oxide. In the latter case the topography of the nanoclusters is generally imaged in the contact mode of the force microscope, 8,9 where the imaging suffers under the tip-surface convolution effect 10 --due to the tip being comparable to the clusters in size, the clusters appear larger and more distorted in the images than in reality.…”

Imaging the domain structure of organic semiconductor films

“…49 For imaging of mesoscale domain structure, the ability to image over relatively large area while maintaining sensitivity to molecular orientation is required. AFM has become a standard laboratory tool for the characterization of film topography with high resolution.…”