The Application Wavelet Transform Algorithm in Testing ADC Effective Number of Bits

Abstract

In evaluating Analog to Digital Convertors, many parameters are checked for performance and error rate.One of these parameters is the device Effective Number of Bits. In classical testing of Effective Number ofBits, testing is based on signal to noise components ratio (SNR), whose coefficients are driven viafrequency domain (Fourier Transform) of ADC’s output signal. Such a technique is extremely sensitive tonoise and require large number of data samples. That is, longer and more complex testing process as thedevice under test increases in resolutions. Meanwhile, a new time – frequency domain approach (known asWavelet transform) is proposed to measure and analyze Analog-to-Digital Converters parameter ofEffective Number of Bits with less complexity and fewer data samples.In this work, the algorithm of Wavelet transform was used to estimate worst case Effective Number of Bitsand compare the new testing results with classical testing methods. Such an algorithm, Wavelet transform,have shown DSP testing process improvement in terms of time and computations complexity based on itsspecial properties of multi-resolutions

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