“…Here we provide a brief review of two experimental techniques used to gleam information about sub-nanometer defects. Point defects in oxides such as UO2, CeO2, and ThO2 have been extensively characterized using light source techniques [322,332,333,334,335,336,337,338,339,340,341,342,343,344]. This field of study has recently been review by Lang, et al [345].…”