The application of a modified Blech product to aluminum-based metallization for increased current density

Manning, Kevin

doi:10.1109/iirw.2012.6468937

Cited by 1 publication

(1 citation statement)

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“…It means that when the product of conductor length (L) and void density (j) is less than a certain threshold, no EM occurs. It has found that shorter Al wires are substantially less susceptible to the EM damage than longer lines when stressed under the same condition [28]. The short-length effect in the DD Cu interconnects has been investigated through the experiments on the lines of different lengths, different current densities in the three-level structure [29].…”

Section: Positive Effects a Short-length Effect (Blech Effect)mentioning

confidence: 99%

Study of the Interconnect Failure Mechanism and Micro-effort for ULSI

Lin¹,

Wu²

2019

IJCCE

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Interconnect reliability has been regarded as a discipline that must be seriously taken into account from the early design phase of ultra large scale integration (ULSI). A synthetic review of valuable solutions to improve interconnect reliability is proposed in this paper. At first, a comprehensive review of the interconnect failure mechanisms and micro-efforts are carried out. Four types of interconnect failure mechanisms including EM, SM, TM and TDDB are illustrated in detail. Depending on their different effects for failure, the interconnect micro-effects are classified into the positive effects including the short-length effect, self-healing effect, reservoir effect and the negative effects which involves the skin effect, joule heating, current crowding , bandwidth, coupled noise, parasitic, RC delay, crosstalk and power dissipation and so on. Secondly, a novel qualitative evaluation method based on the radar chart has been presented, which visually shows the contrast of the key performance related to the interconnect failures. These present results might provide some valuable guidance for the study of IC interconnect reliability.

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Section: Positive Effects a Short-length Effect (Blech Effect)mentioning

confidence: 99%