Abstract-The frequency-or immittance-temperature anomalies occurring in quartz-crystal resonators are generically called activity dips. Because of their potentially disastrous effects on oscillator and filter performance, testing for their presence can represent a considerable addition to the manufacturing cost. An electronic method is described, in several variations, that is rapid, simple, and well adapted to microprocessor control. The electronic method obviates tedious and costly temperature runs. It makes use of the fact that the desired mode of vibration is shifted in frequency by a variable series capacitor, while interfering modes, that cause activity dips, are nearly unaffected.
INTRODUCTIONA NOMALIES in the frequency-or admittancetemperature characteristic of a resonator are called "activity dips" or "bandbreaks." At least two distinct species exist: "design-related" dips and "process-related" dips. The latter type arise from shortcomings in the processing phases where, for example, an improperly deposited electrode film peels or blisters in a reversible, temperature-dependent manner; these are not considered further here. "Design-related" activity dips are those for which the structural configuration remains unaffected by temperature changes, but instead depend solely upon geometry and material constants. The presence of "designrelated" activity dips is a persistent problem and necessitates a good deal of costly testing for medium-and