The fluctuation model with Gaussian-type of barrier heights distribution that was recently applied successfully to explain the dark current -voltage characteristics of Au/GaAs barrier structure with microrelief interface, in this paper is extended to photoelectric characteristics. In addition to the change of the Richardson constant and the apparent temperature coefficient of barrier height we predict the decrease of the open-circuit voltage of photodetectors or solar cells. The theoretical predictions have been verified experimentally on the Au/GaAs Schottky barriers with dendrite-like or quasigrating interface prepared by wet anisotropic etching.1. Introduction Micro/nanorelief metal/semiconductor (MS) interfaces are usually used for a reduction of light reflection and for increase of photocurrent of surface-barrier structures. However, the geometric disorder of such interfaces leads to the worsening of their electronic structure due to the change in their microstructure. The electrical behavior of corresponding Schottky diodes was explained by a two phase (or patch) model with different barrier heights [1]. As a result, in the diodes with rough interfaces the dominating current transport mechanism changes from thermionic emission to thermionic-field emission, the barrier height decreases and its temperature dependence increases. Often some additional treatments are used for smoothing the microrelief. In this case metal/semiconductor barrier can be modeled by a continuous set of diodes with different barrier heights connected in parallel. Several types of barrier height distribution (Gaussian type [2 -5], log-normal [6,7] or their superposition) have been proposed to describe the electrical characteristics of Schottky diodes and have been analyzed to determine the conditions of their suitability [4,7,8]. This fluctuation model with the barrier heights distributed according to Gaussian formula recently was applied successfully to explain the dark current-voltage characteristics of Au/GaAs microrelief interface, prepared by wet chemical anisotropic etching [5].In this work this fluctuation model is extended to photoelectric characteristics of such nonhomogeneous MS interfaces, which are compared with experimental results obtained on Au/GaAs Schottky barriers with dendrite-like or quasi-grating interface.