Abstract:A description of recent work performed by collaboration among the CIMAV Crystal Physics Group, the ILL Diffraction Group and the GEC Nanotechnology Education and Research Centre (NERC), regarding structure-electromagnetic properties relationships, is given. Structure analysis puts emphasis on thin films texture characterization. The new software package ANAELU, for texture analysis via two-dimensional (2-D) diffraction detection, is described. Crystallographic texture plays a significant role on ferroic and mu… Show more
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