Testing the radiometric accuracy of Fourier transform infrared transmittance measurements

Kaplan, Simon G.; Hanssen, Leonard M.; Datla, R. U.

doi:10.1364/ao.36.008896

Cited by 32 publications

(15 citation statements)

References 13 publications

(20 reference statements)

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“…The resultant radiation beam consists of specular (regular) components and diffuse components of the reflection and transmission. The diffuse components can cause that the measured spectra depend on the geometry of the collection optics of the detector system 17 . The radiation beam follows geometrical laws of optics only in the ideal case when no diffusion arises and results in a pure regular reflection and transmission.…”

Section: Resultsmentioning

confidence: 99%

Optical Assets of In situ Electro-assembled Platinum Black Nanolayers

Stanca

Hänschke

Zieger

et al. 2017

Sci Rep

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Optoelectronic technology has been increasingly driven towards miniaturization. In this regard, maintaining the optical properties of the bulk materials while reducing their size is a critical need. How thin must the film be to preserve the bulk material´s optical absorbance and reflectance characteristics? This is the central question for our study of the in situ electro-assembly broad band optical absorber films of platinum in non-aqueous solution of PtCl4. By reducing the in situ constructed film to sub-visible-wavelength thicknesses, the measured reflectance in the region from the ultraviolet to the infrared remained close to that exhibited by the micrometre-width films. These platinum black films broadly absorb electromagnetic waves at a sub-incident-wavelength thickness owing to their plasmonically increased absorbance cross-section. Simulation of various incident energy electron trajectories gives insights into the electron depth through the porous platinum black of ρ = 1.6 g/cm3 and previews the optical behaviour close to the atomic thickness.

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Section: Resultsmentioning

confidence: 99%

Optical Assets of In situ Electro-assembled Platinum Black Nanolayers

Stanca

Hänschke

Zieger

et al. 2017

Sci Rep

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“…beam geometry interaction ͑beam deviation, deflection, and focus shift͒. 11 The integrating-sphere system is not suitable for high-sample-throughput applications. For these applications other instrumentation designed for fast relative measurements can be used.…”

Section: Discussionmentioning

confidence: 99%

Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples

Hanssen¹

2001

Appl. Opt.

112

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An integrating-sphere system has been designed and constructed for multiple optical properties measurement in the IR spectral range. In particular, for specular samples, the absolute transmittance and reflectance can be measured directly with high accuracy and the absorptance can be obtained from these by simple calculation. These properties are measured with a Fourier transform spectrophotometer for several samples of both opaque and transmitting materials. The expanded uncertainties of the measurements are shown to be less than 0.003 (absolute) over most of the detector-limited working spectral range of 2 to 18 microm. The sphere is manipulated by means of two rotation stages that enable the ports on the sphere to be rearranged in any orientation relative to the input beam. Although the sphere system is used for infrared spectral measurements, the measurement method, design principles, and features are generally applicable to other wavelengths as well.

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“…Semi-circular half-blocks are inserted near the input parabolic and output ellipsoidal mirrors in the sample compartment in order to block inter-reflections among the detector, sample, and interferometer, which are a potentially large source of error in FT-IR transmittance measurements. 4 The filter wheel holding the blocking filters is tilted by a sufficient angle (8° in the case of the 174 sample compartment beam geometry of the Bomem DA3) to prevent inter-reflections involving the blocking filter.…”

Section: Methodsmentioning

confidence: 99%

<title>Characterization of narrowband infrared interference filters</title>

Kaplan

Hanssen

1998

Optical Diagnostic Methods for Inorganic Transmissive Materials

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A Fourier-transform infrared (VF-IR) spectrophotometer system is used to measure the transmittance of infrared band-pass filters as a function of wavelength, temperature, and beam geometry. Measurements are performed using an ff4 beam geometry at normal incidence, or a nearly collimated geometry with variable angle of incidence. Blocking filters are used to expand the dynamic range of the out-of-band measurement to transmittances as low as 1116with 4 cm1 resolution.

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Testing the radiometric accuracy of Fourier transform infrared transmittance measurements

Cited by 32 publications

References 13 publications

Optical Assets of In situ Electro-assembled Platinum Black Nanolayers

Optical Assets of In situ Electro-assembled Platinum Black Nanolayers

Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples

<title>Characterization of narrowband infrared interference filters</title>

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