Testing the Goodness of Model Fit in Tunable Diode Laser Absorption Tomography

Nadir, Zeeshan; Rice, Kristin M.; Brown, Michael S.; Bouman, Charles A.

doi:10.2352/issn.2470-1173.2021.15.coimg-291

2021

DOI: 10.2352/issn.2470-1173.2021.15.coimg-291

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Testing the Goodness of Model Fit in Tunable Diode Laser Absorption Tomography

Zeeshan Nadir¹,

Kristin M. Rice²,

Michael S. Brown³

et al.

Abstract: Fast track article for IS&T International Symposium on Electronic Imaging 2021: Computational Imaging proceedings.

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Testing the Goodness of Model Fit in Tunable Diode Laser Absorption Tomography

Abstract: Fast track article for IS&T International Symposium on Electronic Imaging 2021: Computational Imaging proceedings.

This publication either has no citations yet, or we are still processing them

See others like this or search for similar articles

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