Testing stuck-open faults of priority address encoder in content addressable memories

Tsai, Tsai-Ling; Li, Jin-Fu; Hsu, Chun-Lung; Su, Chi-Tien

doi:10.1145/3287624.3287690

Proceedings of the 24th Asia and South Pacific Design Automation Conference 2019

DOI: 10.1145/3287624.3287690

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Testing stuck-open faults of priority address encoder in content addressable memories

Tsai-Ling Tsai

Jin-Fu Li

Chun-Lung Hsu

et al.

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Testing stuck-open faults of priority address encoder in content addressable memories

Cited by 2 publications

References 18 publications

Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability

Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability

Testing and Reliability of Computing-In Memories: Solutions and Challenges

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