Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction

Nassery, Afsaneh; Erol, Osman Emir; Ozev, Sule; Verhelst, Marian

doi:10.1109/tcad.2012.2183370

Cited by 6 publications

(5 citation statements)

References 15 publications

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“…While GA based test generation is one-time optimization, test time per instance decreases significantly compared with prior parameter estimation techniques due to the use of compact test signals. In [2], five OFDM frames are applied where each OFDM frame has duration of 100 µs, whereas in our proposed method, 3.2-µs long compact test signal (single frame) is used. Also in the proposed method, all parameters are computed in a single step contrary to [2] where multistep approach (multiple power levels) is used.…”

Section: Simulation Resultsmentioning

confidence: 99%

“…In this work, we focus on the problem of test stimulus optimization for determining the critical behavioral model parameters of RF systems using nonlinear solvers. Prior research in model parameter computation-based testing [1], [2] used random stimuli resulting in longer than necessary test sequences incurring excessive test times. The key contributions of this work are as follows: 1) We propose an algorithmic test stimulus generation technique for behavioral model parameter computation of RF transceiver systems.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Banerjee

Chatterjee

2015

IEEE Trans. VLSI Syst.

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In this brief, an optimized test stimulus generation technique is proposed for model parameter computation-based diagnosis and testing, which can provide a very compact deterministic test signal and results in significant reduction in test time. The proposed test stimulus generation algorithm maximizes the accuracy with which a nonlinear solver can determine RF transceiver model parameters from raw downconverted test response data. The simulation results show that using optimized test signals, a comprehensive range of model parameters can be computed accurately using a single data acquisition. Data from experiments performed on a hardware prototype are shown to validate the proposed methodology.

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Section: Simulation Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Banerjee

Chatterjee

2015

IEEE Trans. VLSI Syst.

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“…However, these technologies are prone to higher process variations and defect rates, which makes RF BIST both more necessary and more challenging. Several techniques in the literature aim to reduce the dependence on external RF instrumentation for low cost testing [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. In [2][3][4], simple test signals such as multi-tone sinusoidal signals, are used to generate output data, where the performance of RF transceiver is predicted using the output data as well as machine learning methods.…”

Section: Introductionmentioning

confidence: 99%

“…In [5][6][7][8][9][10], the loopback configuration is used to characterize both the transmitter and the receiver. In [5,6], the authors derive the analytical model for the entire loop-back path and use numerical techniques in order to solve transmitter and receiver parameters simultaneously. In [7], authors use similar mathematical models with specialized signals in order to achieve an analytical solution.…”

Section: Introductionmentioning

confidence: 99%

Process independent gain measurement with low overhead via BIST/DUT co-design

Jeong

Kitchen

Ozev

2016

2016 IEEE 34th VLSI Test Symposium (VTS)

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Built-in Self-Test (BIST) is essential, particularly for radio frequency (RF) devices where off-chip RF signal analysis is costly or in some cases, infeasible. Two major problems have made RF BIST elusive. First, process variations make the BIST circuit behavior hard to predict, limiting accuracy of measurements. Second, the overhead, particularly in terms of performance degradation, make RF BIST undesirable. In this paper, we address these two issues for RF BIST gain measurement. First, we show that by setting up relative gain measurements and carefully crafting the BIST methodology and the matching BIST circuit, the effect of process variations on measurement accuracy can be suppressed. Second, by codesigning the BIST circuit together with the device under test (DUT), performance impact can be eliminated or significantly reduced. To demonstrate the proposed approach, we design a low noise amplifier (LNA) as the DUT together with the BIST circuit. We also design a stand-alone LNA with the same specifications and manufacture these two circuits on the same die. We show that the LNA gain can be determined very accurately, using only DC measurements, and the performance impact of the BIST circuit is negligible.

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“…In [7]- [10], the authors use the loop-back configuration to characterize both the transmitter and the receiver. In [8], [9], an analytical model is derived for the entire path and numerical techniques are used to solve for transmitter and receiver parameters simultaneously. In [7], similar mathematical models are used in conjunction with specialized signals to achieve an analytical solution.…”

Section: Introductionmentioning

confidence: 99%

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters

Jeong

Ozev

Sen

et al. 2013

2013 IEEE 31st VLSI Test Symposium (VTS)

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Polar transmitters are desirable for portable devices due to higher power efficiency they provide compared to traditional Cartesian transmitters. However, the difference in architecture results in differences in potential circuit impairments/fault models, leading to different test/measurement/calibration requirements. The delay skew between the envelope and phase signals and the finite envelope bandwidth can create inter modulation distortion that leads to the violation of the spectral mask and error vector magnitude (EVM) requirements. Therefore, measurement and compensation/calibration of these parameters are important to ensure proper operation for the polar transmitter. In this paper, we propose a technique to measure the delay skew and the finite envelope bandwidth based on the measurement of the 3 rd order inter modulation distortion (IMD3) at the output of the transmitter. First, a two-tone input at a sufficiently low frequency is applied to the transmitter baseband input to calculate the delay. Then, we apply another two-tone input at a relatively higher frequency to determine the envelope bandwidth. Simulation and hardware measurement results show that the proposed technique can characterize the targeted impairments in the polar transmitter accurately within 10ms which is negligible compared to signal source switching and settling times. I. IEEE 31st VLSI Test Symposium (VTS)978-1-4673-5543-8/13/$31.00 ©2013 IEEE

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Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction

Cited by 6 publications

References 15 publications

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

Process independent gain measurement with low overhead via BIST/DUT co-design

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters

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