Test-retest reliability of EEG microstate metrics for evaluating noise reductions in simultaneous EEG-fMRI
Toshikazu Kuroda,
Reinmar J. Kobler,
Takeshi Ogawa
et al.
Abstract:Simultaneous EEG-fMRI has potential for elucidating brain activities but suffers from severe noise/artifacts in EEG. While several countermeasures have been developed, it remains difficult to evaluate noise reductions in the absence of ground truth in EEG. We introduce a new evaluation method which takes advantage of high test-retest reliability of EEG microstate metrics. We assumed, if the reliability is high for a pair of EEG recorded outside an MR scanner on two different days, then it should also be high f… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.