International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)
DOI: 10.1109/test.1999.805621
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Test process optimization: closing the gap in the defect spectrum

Abstract: This paper describes our methodology of tuning the test process of the Motorola' Operations and Maintenance Center (OMC) product to systematically reduce field defects. The benefits include improved test cases, reduced defects and the availability of up to date field data'for feature verijication.

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Cited by 5 publications
(2 citation statements)
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“…According to [11,12], a literature survey of theoretical knowledge and published practices must be complemented with industry observation to find out the commonalities of a specific problem.…”
Section: B Research Designmentioning
confidence: 99%
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“…According to [11,12], a literature survey of theoretical knowledge and published practices must be complemented with industry observation to find out the commonalities of a specific problem.…”
Section: B Research Designmentioning
confidence: 99%
“…Barett et al [11] use the idea of a mapping matrix for optimizing the testing process. The matrix is filled by placing VVAs and defect types in rows and columns, respectively.…”
Section: Strategy For the Selection Of Cost-effective Vvasmentioning
confidence: 99%