Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

Abstract

The demand for testability analysis has increased with the integration densities and complexity of circuits. As an important part of testability analysis, the test point selection method needs to be researched in depth. A new similarity coefficient criterion is proposed to determine the fault isolation degree because output responses of a circuit with component tolerance are approximately subject to the normal distribution. Then, a new test point selection method is proposed based on the fault-pair similarity coefficient criterion information table. Simulation experiments are used to validate the accuracy of the proposed method in terms of the optimum test point set and fault isolation degree. The results show that the proposed method improves the performance of test point selection by comparing with the other reported methods.

A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm

“…In this way, the subsequent fault diagnosis can obtain a high fault isolation rate. Besides, the number of test vectors has a great impact on test time and cost, viz., the number of test vectors (columns in (10)) should be minimized. Totally there are N = 2 n possible test vectors.…”

“…The first individual in this ND set is p (1) . Where, p (1) = [0 0 0 0 0 0 0 1 0 1 0 1 1 1 1], the test vectors d (8) , d (10) , d (12) , d (13) , d (14) , d (15) are selected, while the others are not selected.…”

“…d (5) {R1, R2, R5}, {R3}, {R4}, {R6}, {R7}, {R8} d (6) {R1, R2, R5}, {R3}, {R4}, {R6}, {R7}, {R8} d (8) {R1,R2,R3,R5,R6,R7,R8},{R4} d (9) {R1}, {R2, R8}, {R3}, {R4}, {R5}, {R6}, {R7} d (10) {R1}, {R2, R8}, {R3}, {R4}, {R5}, {R6}, {R7} d (11) { 1}, { 2}, { 3}, { 4}, { 5}, { 6}, { 7}, { 8} d (12) { 1}, { 2}, { 3}, { 4}, { 5}, { 6}, { 7}, { 8} d (13) {R1, R2, R5}, {R3}, {R4}, {R6}, {R7}, {R8} d (14) {R1, R2, R5}, {R3}, {R4}, {R6}, {R7}, {R8} d (15) {R1,R2,R3,R5,R6,R7,R8},{R4} (7) d (3) 74.428 d (4) 77.106 d (11) 76.931 d (12) 73.904…”

“…Testability design is a significant research topic for fault diagnosis in mixed signal circuit. It performs test generation [1,17,22] and test point selection [9,10,24] to improve observability of a CUT. The study of these technologies has great importance in reducing the test complexity and design cost and enhancing the circuit fault diagnosis accuracy.…”

Fault diagnosis of analogue circuits based on artificial intelligence algorithms

“…In addition, Qingfeng, M. et al proposed a test point selection method based on the fault pair similarity coefficient criterion information table for the analog circuit element tolerance circuit output response approximately obeying the normal distribution, which was shown to improve the performance of the test point selection through testing [17]. Gao, T. Y. et al proposed a firefly algorithm optimized by using the frequency response characteristics and proposed an analog circuit fault diagnosis method based on the support vector machine for analog circuit fault diagnosis, which was fully validated in the fault diagnosis simulation of Sallen-Key bandpass filter and quad op-amp [18].…”