1984
DOI: 10.1016/0167-9260(84)90006-3
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Test generation through logic programming

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Cited by 14 publications
(5 citation statements)
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“…The same circuit description can be used in various applications including simulation, formal verification and fault diagnosis (see [62]). Similar ways of describing hardware in logic programming are reported in [11,22,32,33,68].…”
Section: Circuit Descriptionmentioning
confidence: 74%
“…The same circuit description can be used in various applications including simulation, formal verification and fault diagnosis (see [62]). Similar ways of describing hardware in logic programming are reported in [11,22,32,33,68].…”
Section: Circuit Descriptionmentioning
confidence: 74%
“…CHN89 [40] in Table 3. 6 In comparison, the single greedy strategy G1 with a backtrack limit of 15 fails to complete on only 105 redundant faults for the same seven networks.…”
Section: Efficiencymentioning
confidence: 97%
“…Most test generation algorithms use analysis of a network (or equation) to determine a variable ordering, such as the backtracing heuristics in a structural algorithm. The orderings used by early SAT-based algorithms depend primarily on the underlying solvers, although they can be influenced by ordering the problem description [6] or the use of other mechanisms [13]. Recent SATbased algorithms [14,15,22,16,23,17] analyze the 2-clauses of an equation, satisfying the easy part of the equation and then checking if the assignment also satisfies the entire equation.…”
Section: Greedy Searchmentioning
confidence: 99%
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