2023 IEEE 41st VLSI Test Symposium (VTS) 2023
DOI: 10.1109/vts56346.2023.10140039
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Test Generation for Defect-Based Faults of Scan Flip-Flops

Yu-Teng Nien
1
,
Chenhong Li
2
,
Po-Tsung Wu
3
et al.
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