2010 International Conference on Field Programmable Logic and Applications 2010
DOI: 10.1109/fpl.2010.49
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Test Compression for Dynamically Reconfigurable Processors

Abstract: We present the world's first test compression technique that features automation of compression rules for test time reduction on dynamically reconfigurable processors. Evaluations on an actual 40-nm product show that our technique achieves a 2.7 times compression ratio for original configuration information (better than does GZIP), the peak decompression bandwidth of 1.6 GB/s, and 2.7 times shorter test times.

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