Test Compression for Dynamically Reconfigurable Processors

Abstract

We present the world's first test compression technique that features automation of compression rules for test time reduction on dynamically reconfigurable processors. Evaluations on an actual 40-nm product show that our technique achieves a 2.7 times compression ratio for original configuration information (better than does GZIP), the peak decompression bandwidth of 1.6 GB/s, and 2.7 times shorter test times.