2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel 2008
DOI: 10.1109/eeei.2008.4736543
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Test automation of distributed embedded systems based on test object structure information

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Cited by 5 publications
(2 citation statements)
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“…In systems engineering there exist methods and complex languages to describe plants and control and bus structures [8]. A simple language to describe the configuration of the test object was proposed [9]. The description of the configuration of the test object enables white-box system testing.…”
Section: Introductionmentioning
confidence: 99%
“…In systems engineering there exist methods and complex languages to describe plants and control and bus structures [8]. A simple language to describe the configuration of the test object was proposed [9]. The description of the configuration of the test object enables white-box system testing.…”
Section: Introductionmentioning
confidence: 99%
“…[Silvie Jovalekic et al, 2008][10] have proposed cause and effect graphs which are time-dependent to describe the test cases considering the distribution and real-time properties. Tests object structure used for undertaking the testing in-depth.…”
mentioning
confidence: 99%