1998
DOI: 10.1016/s0142-1123(97)00080-7
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Tension-tension fatigue of copper thin films*1

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Cited by 150 publications
(53 citation statements)
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“…The strength of this material is much higher than values of yield and ultimate strength for pure Cu in bulk. This finding is typical for fine grain size specimens and is consisting with prior studies for copper thin films (Read 1998;Sanders et al 1997;Legros et al 2000;Huang et al 2000). The experimentally modulus values of 103 GPa in loading and 107 GPa in unloading of 300 nm copper films were calculated from Fig.…”
Section: Sputtering Coppersupporting
confidence: 75%
“…The strength of this material is much higher than values of yield and ultimate strength for pure Cu in bulk. This finding is typical for fine grain size specimens and is consisting with prior studies for copper thin films (Read 1998;Sanders et al 1997;Legros et al 2000;Huang et al 2000). The experimentally modulus values of 103 GPa in loading and 107 GPa in unloading of 300 nm copper films were calculated from Fig.…”
Section: Sputtering Coppersupporting
confidence: 75%
“…Smaller specimens cannot be handled manually for gripping, and would require more elaborate specimen designs and test procedures, such as the silicon-framed tensile specimen [4] or use of other rigid support substrates [5].…”
Section: Figurementioning
confidence: 99%
“…For instance, copper (Cu) thin films exhibited a lower Young's modulus but higher yield and ultimate tensile strengths than their bulk counterparts under cyclic tensile loading. 19) Similarly, persistent slip bands (PSBs) were prevalent in bulk Cu and gold (Au) samples upon deformation whereas they were absent in Cu and Au thin wires. Specifically, the existence of PSBs and the extrusions on these PSBs lead to local increases in the stress field, and thereby formation of several crack initiation sites.…”
Section: )mentioning
confidence: 99%