Tensile Loading Device for Kossel Microdiffraction and Metallography

Abstract

A loading device used primarily in conjunction with Kossel (divergent beam) x-ray diffraction is described. The device is compatible with any standard upright metallograph as well. It is 10.1 cm in diameter and accommodates specimens 2.5 cm in reduced section by 6 mm wide. The device utilizes small load cells having ranges of 0 to 44.5 N and 0 to 445 N respectively. Load cell error is ±0.5% of the full load capacity. Load changes of 0.2% of load capacity can be observed. The load device is mechanically and electrically stable. Loads are read on a standard commercial universal indicator.

Semiautomatic Determination of Orientations and Elastic Strain from Kossel Microdiffraction

“…The Kossel technique is suitable for orienting a crystal, refinement of lattice parameters and for estimation of structure factors. These applications were advanced in the sixties with the use of electron probe microanalyzers (see, e.g., [6,7]). Nowadays, with the progress in digital cameras and the possibility of direct computer analysis of diffraction patterns, the use of the Kossel technique for strain determination is being considered again.…”

The Divergent beam (Kossel) x-ray method and its uses in measuring strain contours in an individual grain of Fe-3 weight percent Si transformer sheet

“…Finally, a modular design can be modified at will to incorporate improvements. Hence, the decision was made to design and build a separate Kossel Pattern Generator (KPG) suitable for operation in the trans mission mode [54,55], An air camera offers the advantage of allowing multiple exposures without disturbing the vacuum conditions or the orientation of the specimen. With respect to increased exposure times involved with air path cameras, the softest radiation used to date in quantitative transmission Kossel work has been V Ka at 2.5 A.…”

“…Maximum drift was 0.03 pounds (14 g). Complete details of the loading device have been presented by Vieth and Yakowitz [55].…”

X-ray diffraction from micro-crystals in scanning electron beam instruments

“…In the opinion of the authors the use of the technique has not been as widespread as it could have been because of the shortcomings of the camera designs which have interfered with the main use of the electron beam instrument used to generate the pattern. For this reason Vieth and Yakowitz [4] have produced a Kossel pattern generator to be used just for this purpose. A design of camera is also required which can be incorporated into electron optical instruments, e.g., scanning microscopes and microanalysers so that Kossel patterns could always be recorded without affecting the main use of the instrument.…”