Ten: A concurrent test engineering environment

Trischler, E.; Johansson, Mats I.

doi:10.1109/mdt.1994.303843

Cited by 3 publications

(1 citation statement)

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“…To date, the growth in size and complexity have made testing of circuits difficult and expensive. Indeed, the test cost of electrical products is growing more rapidly than other components of the overall product cost [10]. Furthermore, minimizing the product development time requires the integration of design and test at early stages of the product development.…”

Section: Introductionmentioning

confidence: 99%

Design of modular digital circuits for testability

Kusiak

Huang

1997

IEEE Trans. Comp., Packag., Manufact. Technol. C

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Modular products and reconfigurable testing processes are crucial in modern manufacturing. This paper discusses the concept of product modularity, test modules of increased reusability and exchangeability, and some aspects of design for testability. A methodology for design of modular products for testability in the presence of testing modules is developed. An integrated approach to design of modular products and test processes is discussed. The relationship between product modularity and design for testability is explored. This paper focuses on digital circuits which may be difficult to decompose into modules. The impact of testability on module sizes is considered. The testability points are identified at the circuit level while modular testing is considered at the board and system level. The main contribution of this paper is in the development of a formal approach to modularize products, and to assess the impact of modularity on the design process and testability.

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Section: Introductionmentioning

confidence: 99%