Abstract:Experiments have been performed which show that a grooved planar high purity germanium semiconductor detector may give rise to time variant counting rates in energy regions below prominent spectral peaks. It is postulated that this effect is due to prolonged or incomplete charge collection in the vicinity of the bottom of the groove, and is caused by distortions in the applied electric field in this region. Such effects may lead to changes in the minimum detectable count rate in x-ray fluorescence measurements… Show more
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