1986
DOI: 10.1109/tmtt.1986.1133471
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Temperature-Variable Characteristics and Noise in Metal--Semiconductor Junctions

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Cited by 23 publications
(6 citation statements)
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“…2, that our developed SDD model predicts the measured characteristic at 300 K. To predict the performance at cryogenic temperatures, representative values for the remaining model parameters are assumed. From the I-V characteristic at 77 K it is seen that the current level for a given voltage is lower and the slope is steeper than at 300 K in accordance with observations found in the literature [5]- [6]. III.…”
Section: Schottky Barrier Diode Modelingsupporting
confidence: 90%
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“…2, that our developed SDD model predicts the measured characteristic at 300 K. To predict the performance at cryogenic temperatures, representative values for the remaining model parameters are assumed. From the I-V characteristic at 77 K it is seen that the current level for a given voltage is lower and the slope is steeper than at 300 K in accordance with observations found in the literature [5]- [6]. III.…”
Section: Schottky Barrier Diode Modelingsupporting
confidence: 90%
“…The maximum current is related to the resistance of the epi-layer which drops to a low value at cryogenic temperatures. Interestingly, the temperature dependence of the velocity saturation effect as described in [6] is shown to be of less importance for the considered millimeter-wave frequency doubler.…”
Section: Model Verification Against Measured Datamentioning
confidence: 92%
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“…where η(T nom ) is the ideality factor extracted at T nom . The expression for the forward I-V characteristic in (7) remains valid for the triple-anode varactor diode stack only up to the so-called flat-band condition [18]. The flat-band condition is given as V fb = V bi − V j = 3 × kT /q where the built-in potential has been introduced.…”
Section: A) Forward I-v-t Characteristicsmentioning
confidence: 99%