Temperature Rise of Metallized Film Capacitors Under AC and DC Superimposed Voltage

Wang, Zijian; Ying-jie, Lü; Ma, Yanfeng

doi:10.1109/tps.2021.3128640

Cited by 6 publications

(3 citation statements)

References 25 publications

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“…Using polynomial (16) and Equation (17) or Equation ( 18), it is possible to estimate or even predict the capacitance at different temperatures when having data on the dielectric constant changed with the temperatures of a film consisting of new materials. This will provide a reference for the performance prediction of film capacitors with new materials and the accelerated ageing of film capacitors at high temperatures.…”

Section: The Influence Of Temperaturementioning

confidence: 99%

“…Researchers have studied the film or film capacitor's characteristics of the capacitance loss [12], location of hot spots [13], breakdown voltage [14], mechanical properties [15], dielectric constant [16], and thermal expansion caused by the temperature changes. In addition, to analyse the temperature rise characteristics of film capacitors under superimposed AC and DC voltages [17], researchers also tried to optimise their temperature rise performance by optimising the size design of film capacitors [18]. In more aspects, some progress has been made in the research of dielectric film materials for high temperature requirements [19,20], for example, compounding different materials or constructing special structures to improve the high temperature performance of the materials of film capacitors [20].…”

Section: Introductionmentioning

confidence: 99%

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Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

et al. 2023

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In the process of coping with energy and environmental protection issues, technologies such as energy materials, energy devices, and energy systems have made great progress. With excellent performance, film capacitors play an increasingly important role in energy‐related fields. With the increase of application scenarios and the continuous development of film material technology, it is urgent to establish a better theoretical connection from films to capacitors. First, the main components of the capacitor including the film and the positional relationships among them are given. Then, from the two perspectives of indirect calculation according to the volume and the direct calculation according to the winding process, the equation between the dielectric constant of films and the corresponding capacitance of capacitors is established. Further, the measurement data and error analysis results of the built test platform prove the accuracy and great potential of the proposed calculation methods. In addition, error sources, including film thickness uniformity, are listed. Finally, the challenges faced by the proposed calculation methods and the paths that can be referenced for future research are summarised and discussed.

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Section: The Influence Of Temperaturementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

et al. 2023

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“…Such research work mainly focused on assessing the failure mechanism, reliability evaluation, and predicting the lifetime of MPFC [14][15][16][17][18][19] . Relevant studies on thermal stress primarily studied the influence of temperature field and temperature augmentation on the performance of DCLC 20,21 .…”

Section: Introductionmentioning

confidence: 99%

Effect of thermal stress on the life of DC link capacitors for smart grid

Sun,

Qiao,

et al. 2024

Preprint

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Thermal stress is an important factor affecting the life of a DC link capacitor (DCLC). However, relevant studies on thermal stress mechanism directly influencing the lifetime of the capacitor are rarely reported. In this paper, the thermal polymerization of DCLC has been analyzed, and the relevant experimental platforms have been developed to evaluate the breakdown strength of DCLC at two thermal polymerization temperatures (TPTs). Simultaneously, the aging analysis of DCLC at different TPTs and the accelerated lifetime measurements at various temperatures were also executed to attain insights into the influence of thermal stress on the lifetime of DCLC. The results showed that the stress caused by thermal polymerization and working temperature influenced the breakdown voltage capability and the lifetime of DCLC. With an increase in TPT by 5 °C, a step-increase in the withstand voltage capability of DCLC from 7,000 V to 7,200 V was observed that demonstrated an enhancement of 2.86%in the breakdown strength performance. Correspondingly, the lifetime of DCLC with a capacitance change rate of -3% enhanced from 1,500 hours to 1,700 hours. However, severe deterioration in the life span of DCLC from 4,200 hours to 500 hours was observed with an increasing operating temperature from 55 °C to 85 °C, respectively. The lifetime could be enhanced by increasing the thermal polymerization temperature as well as reducing the working temperature. The presented results could be termed a harbinger for industrial production of high-performance DCLC with enhanced lifetime that augers well for high-power applications.

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Design of Increasing Dielectric Constant of Metallized Film Capacitor to Reduce Its Volume in MMC

Feng

et al. 2023

Lecture Notes in Electrical Engineering

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Temperature Rise of Metallized Film Capacitors Under AC and DC Superimposed Voltage

Cited by 6 publications

References 25 publications

Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

Theoretical connection from the dielectric constant of films to the capacitance of capacitors under high temperature

Effect of thermal stress on the life of DC link capacitors for smart grid

Design of Increasing Dielectric Constant of Metallized Film Capacitor to Reduce Its Volume in MMC

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