Temperature profile measurements of near-field optical microscopy fiber tips by means of sub-micronic thermocouple

Thiéry, Laurent; Marini, Nathalie; Prenel, Jean-Pierre; Spajer, M.; Bainier, C.; Courjon, D.

doi:10.1016/s1290-0729(00)00231-3

Cited by 22 publications

(8 citation statements)

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“…Available diameters are 5, 1.3, and 0.5 m. The silver cladding ͑diameter about 75 m͒ is removed by chemical ͑nitric acid͒ or electrochemical etching process. 13 We have extensively used our micrometric thermocouples in different applications 13,14 and in spite of their fragility they remain an ideal means for temperature measurement on microsystems in a large temperature range. 15 Extending their possibilities to active mode of operation represents a step toward new possibilities of quantitative thermal imaging.…”

Section: Submicron Wire Thermocouplesmentioning

confidence: 99%

Two omega method for active thermocouple microscopy

Thiéry

Gavignet

Cretin

2009

Review of Scientific Instruments

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We present a contribution to a new mode of scanning thermal microscopy (SThM) based on the use of thermoelectric junction operating in ac active mode. This is the first alternative to 3omega operating mode of a resistive SThM probe for measuring thermophysical parameters of materials at micro- and nanoscale. Whereas a current at omega frequency generates by Joule effect a 2omega thermal oscillation along the wires, the junction thermoelectric voltage can be measured by means of a differential bridge scheme associated to a lock-in amplifier. A thermal model is presented that confirms measurements performed in different situations with different wire probes. Values of thermal contact conductance of different materials have been extracted and a comparison has been performed between this technique and the resistive 3omega mode.

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Section: Submicron Wire Thermocouplesmentioning

confidence: 99%

Two omega method for active thermocouple microscopy

Thiéry

Gavignet

Cretin

2009

Review of Scientific Instruments

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“…8,[14][15][16][17] Using a thermocouple positioned along the taper region of the probe tens of microns from the aperture, temperatures as high as 470°C were measured. 8 Since the temperature was recorded along the probe taper, however, it remained unclear how much heating the sample actually experienced under the aperture of the NSOM probe.…”

Section: Introductionmentioning

confidence: 99%

Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

Dickenson

Erickson

Mooren

et al. 2007

Review of Scientific Instruments

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Tip-induced sample heating in near-field scanning optical microscopy ͑NSOM͒ is studied for fiber optic probes fabricated using the chemical etching technique. To characterize sample heating from etched NSOM probes, the spectra of a thermochromic polymer sample are measured as a function of probe output power, as was previously reported for pulled NSOM probes. The results reveal that sample heating increases rapidly to ϳ55-60°C as output powers reach ϳ50 nW. At higher output powers, the sample heating remains approximately constant up to the maximum power studied of ϳ450 nW. The sample heating profiles measured for etched NSOM probes are consistent with those previously measured for NSOM probes fabricated using the pulling method. At high powers, both pulled and etched NSOM probes fail as the aluminum coating is damaged. For probes fabricated in our laboratory we find failure occurring at input powers of 3.4± 1.7 and 20.7± 6.9 mW for pulled and etched probes, respectively. The larger half-cone angle for etched probes ͑ϳ15°for etched and ϳ6°for pulled probes͒ enables more light delivery and also apparently leads to a different failure mechanism. For pulled NSOM probes, high resolution images of NSOM probes as power is increased reveal the development of stress fractures in the coating at a taper diameter of ϳ6 m. These stress fractures, arising from the differential heating expansion of the dielectric and the metal coating, eventually lead to coating removal and probe failure. For etched tips, the absence of clear stress fractures and the pooled morphology of the damaged aluminum coating following failure suggest that thermal damage may cause coating failure, although other mechanisms cannot be ruled out.

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“…Early work explored heating effects using thermocouples positioned tens of microns from the tip aperture, in the taper region of the probe. 4,5 These studies found temperatures as high as 470°C, before eventual tip failure. 4 With the thermocouple positioned 25 m from the tip aperture, temperature increases of 60°C per mW of light coupled into the fiber were measured.…”

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Sample heating in near-field scanning optical microscopy

Erickson

Dunn

2005

Applied Physics Letters

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Heating near the aperture of aluminum coated, fiber optic near-field scanning optical microscopy probes was studied as a function of input and output powers. Using the shear-force feedback method, near-field probes were positioned nanometers above a thermochromic polymer and spectra were recorded as the input power was varied. Excitation at 405 nm of a thin polymer film incorporating perylene and N-allyl-N-methylaniline leads to dual emission peaks in the spectra. The relative peak intensity is temperature sensitive leading to a ratiometric measurement, which avoids complications based solely on intensity. Using this method, we find that the proximal end of typical near-field probes modestly increase in temperature to 40-45°C at output powers of a few nanowatts ͑input power of ϳ0.15 mW͒. This increases to 55-65°C at higher output powers of 50 nW or greater ͑input power of ϳ2-4 mW͒. Thermal heating of the probe at higher powers leads to probe elongation, which limits the heating experienced by the sample.

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Temperature profile measurements of near-field optical microscopy fiber tips by means of sub-micronic thermocouple

Cited by 22 publications

References 0 publications

Two omega method for active thermocouple microscopy

Two omega method for active thermocouple microscopy

Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

Sample heating in near-field scanning optical microscopy

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