Temperature distribution measurement by using a single-shot normal incidence imaging ellipsometer scheme

Tserendolgor, D.; Baek, Byung Joon; Kim, Daesuk

doi:10.1109/ifost.2012.6357689

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2013

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“…In our previous works, a single shot off-axis digital holography based on a Mach-Zehnderinterferometric scheme [10] and also, a single shot normal incidence imaging ellipsometer scheme [11] were used for the investigation of the temperature distribution measurement of the object.…”

Section: Discussionmentioning

confidence: 99%

Temperature distribution measurement by using off-axis digital holographic microscopy

Tserendolgor

2013

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Wedescribe a single-shot off-axis digital holographic microscopy based on a Michelson interferometric scheme for measuring temperature distribution of a microheater. The temperature variation of the micro heater substrate can result in the refractive index change. Therefore, the temperature can be obtained by detecting of reconstructing object phase image, which is dependent of the temperature distribution in real time. The experimental results demonstrate the feasibility and effectiveness of the off axis digital holography in various surface temperature distribution measurement applications.

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Section: Discussionmentioning

confidence: 99%