Temperature dependent studies on radio frequency sputtered Al doped ZnO thin film

Bhujbal, Pankaj K.; Pathan, Habib M.; Chaure, Nandu B.

doi:10.30919/es8d1003

Cited by 15 publications

(13 citation statements)

References 53 publications

(72 reference statements)

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“…The melting point depression was also observed in other metal nanomaterials, such as zirconium and aluminum . Semiconductor nanostructures are key functional and structural components for devices such as nanoelectronics, , solar cells, − nanocircuits, laser diodes, sensors, , energy conversion and storage systems, , and water treatment systems − because of their unique physical and chemical properties. Unlike metal nanostructures, the thermal stability of semiconductor nanostructures has been rarely investigated.…”

Section: Introductionmentioning

confidence: 99%

Size and Crystal Orientation-Dependent Thermal Behaviors of ZnO Nanobelts

et al. 2020

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We report the size and crystal orientation-dependent thermal behaviors of zinc oxide (ZnO) nanobelts revealed by transmission electron microscopy (TEM) and atomic force microscopy imaging. Direct observation of lattice evolution upon heating unveiled an increase in thermal expansion, yet a decrease of melting point with decreasing ZnO dimensions. Additionally, ZnO nanobelts exhibited orientation dependency on thermal behaviors. High-resolution TEM inspection together with molecular dynamics simulations jointly revealed severe lattice distortion and expansion at and near the nanobelt surface and strong orientation dependency on binding energy. These findings advance our understanding of nano-enabled properties and provide additional design guidelines for developing nanodevices.

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Section: Introductionmentioning

confidence: 99%

Size and Crystal Orientation-Dependent Thermal Behaviors of ZnO Nanobelts

et al. 2020

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“…The results of a number of experimental studies are of great importance for understanding the mechanisms of occurrence of temperature stresses in the process of curing of the repair patch and possible ways to reduce them [37,38]. Study of the temperature deformations occurring in the structure under various temperature and time conditions of polymerization are dealt with in [39,40].…”

Section: Introductionmentioning

confidence: 99%

Effects of the Temperature–Time Regime of Curing of Composite Patch on Repair Process Efficiency

et al. 2021

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Repair procedures with the use of composite patches are considered to be the most effective among the current technologies of repair of the structures of various applications. In the process of moulding-on of a patch made of polymeric composite material by means of curing, technological stresses arise in the patch. Determination of residual technological stresses is a priority task for the modelling of the repair process. Reduction of residual stresses can be achieved by optimization of the mode of repair patch curing. For meeting this objective, the method for determination of technological stresses, which arise in the structure under repair in the process of curing of a composite patch, has been developed. The method takes into account the shrinkage, change in physico-mechanical characteristics, rheological processes occurring in the binder during moulding process, and determination of stresses in the structure under repair at any time. Therefore, premature failure of the repair joint at the stage of repair can be avoided. It is shown that the method adequately describes the level of deformations and stresses in the structure being repaired at the stage of heating and holding of the composite patch. Increase in the moulding temperature leads to a reduction in residual stresses in the structure under repair. However, current stresses at the stages of heating and temperature holding are increased significantly. Reliability of assumptions and developed method is confirmed by the comparison with the experimental data. The obtained experimental graph of total deformation of the composite patch allowed us to clearly determine the moment of residual stress occurrence in the structure under repair. This moment matches quite exactly (with the discrepancy not exceeding 5 min) the gel point determined analytically based on dependence of the degree of curing on the moulding mode. Consequently, the research together with the results previously obtained allows making an integrated choice of geometric parameters of the repair composite patch and temperature–time regime of its curing in order to ensure the specified level of strength and stiffness of the structure under repair.

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“…Different doped (Al, Ga, In) zinc oxide (ZnO) films exhibit good electrical conduction and optical transmission in the visible region. [20][21] In different experiment many groups have shown the promising results of electrical resistivity (10 -4 • cm) and high optical transmission (more than 90%) in case of doped Zinc oxide (ZnO) [22,23] thin films. The results such as, conductivity, optical transmission and sheet resistance of doped ZnO thin film, makes itself an alternative TCO material.…”

Section: Introductionmentioning

confidence: 99%

Study the Effect of ZnO/Cu/ZnO Multilayer Structure by RF Magnetron Sputtering For Flexible Display Applications

Das¹,

Roymahapatra²,

Nandi³

et al. 2021

ES Mater. Manuf.

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ZnO/Cu/ZnO multilayer structured glass and Polyethylene naphthalate (PEN) with different thickness of copper (Cu) layer were prepared by RF magnetron sputtering at room temperature. The electrical resistivity of the films were achieved 8.610 -5 •cm and 4.510 -4 •cm, carrier concentration of 5.3210 21 cm -3 and 1.3610 21 cm -3 , low sheet resistance of 12 /cm 2 and 16 /cm 2 respectively on glass and PEN substrate respectively with optical transmission of more than 80% for both cases at the optimum copper layer thickness. Conduction mechanism of the multilayer structure has been explained in terms of metal to oxide carrier injection with the variation of the thickness of the Cu layer. Different optimization procedures were used to achieve good optically transparent and electrically conductive films. The structural characterizations of multilayer films were carried out by X-ray diffraction (XRD); surface morphology, and topography were performed by scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively. The value of sheet resistance of the structure was influenced by the deposition condition of both layers. Effect of substrate and thickness of the Cu layer was investigated and illustrated.

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Temperature dependent studies on radio frequency sputtered Al doped ZnO thin film

Cited by 15 publications

References 53 publications

Size and Crystal Orientation-Dependent Thermal Behaviors of ZnO Nanobelts

Size and Crystal Orientation-Dependent Thermal Behaviors of ZnO Nanobelts

Effects of the Temperature–Time Regime of Curing of Composite Patch on Repair Process Efficiency

Study the Effect of ZnO/Cu/ZnO Multilayer Structure by RF Magnetron Sputtering For Flexible Display Applications

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