On the method of photoluminescence spectral intensity ratio imaging of silicon bricks: Advances and limitations J. Appl. Phys. 112, 063116 (2012) Measurement of net dopant concentration via dynamic photoluminescence J. Appl. Phys. 112, 063704 (2012) Luminescence and deep-level transient spectroscopy of grown dislocation-rich Si layers AIP Advances 2, 032152 (2012) The role of excess minority carriers in light induced degradation examined by photoluminescence imaging J. Appl. Phys. 112, 033703 (2012) Effect of hydrofluoric acid concentration on the evolution of photoluminescence characteristics in porous silicon nanowires prepared by Ag-assisted electroless etching method