It is of great importance
to understand the thermal properties
of MoSe2 films for electronic and optoelectronic applications.
In this work, large-area polycrystalline MoSe2 films are
prepared using a low-cost, controllable, large-scale, and repeatable
chemical vapor deposition method, which facilitates direct device
fabrication. Raman spectra and X-ray diffraction patterns indicate
a hexagonal (2H) crystal structure of the MoSe2 film. Ellipsometric
spectra analysis indicates that the optical band gap of the MoSe2 film is estimated to be ∼1.23 eV. From the analysis
of the temperature-dependent and laser-power-dependent Raman spectra,
the thermal conductivity of the suspended MoSe2 films is
found to be ∼28.48 W/(m·K) at room temperature. The results
can provide useful guidance for an effective thermal management of
large-area polycrystalline MoSe2-based electronic and optoelectronic
devices.