2012
DOI: 10.1063/1.3698322
|View full text |Cite
|
Sign up to set email alerts
|

Temperature-dependent electron transport in highly ordered Co/Al2O3 core-shell nanocrystal memory synthesized with di-block co-polymers

Abstract: Di-block copolymer synthesized Co/Al 2 O 3 core-shell nanocrystal (NC) capacitors were fabricated in order to study the temperature-dependent electron transport. The capacitance-voltage memory window is shown to increase proportionally with the substrate temperature, saturating at 3.5 V, at 175 C. At elevated operating temperatures, the tunneling of electrons increases, resulting in large flatband voltage shift. Furthermore, the electron leakage of the NCs at high temperature is faster than the leakage at room… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2013
2013
2017
2017

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 25 publications
0
1
0
Order By: Relevance
“…With a longer space between NCs, the probability of lateral electron migration is lower. On the other hand, in order to discuss the thermally activated charge loss mechanism, the temperature effect is also demonstrated, and the activation energy for the thermally activated charge loss is calculated from the Arrhenius equation: t ¼ 0 e E a =kT , 30) where t is the charge loss time at a certain charge remaining ratio, E a is the activation energy, k is the Boltzmann constant, and T is the absolute temperature at 25, 55, and 85 C for the retention time measurement. Figure 6(b) shows ln t as a function of thermal energy (1=kT ).…”
Section: Resultsmentioning
confidence: 99%
“…With a longer space between NCs, the probability of lateral electron migration is lower. On the other hand, in order to discuss the thermally activated charge loss mechanism, the temperature effect is also demonstrated, and the activation energy for the thermally activated charge loss is calculated from the Arrhenius equation: t ¼ 0 e E a =kT , 30) where t is the charge loss time at a certain charge remaining ratio, E a is the activation energy, k is the Boltzmann constant, and T is the absolute temperature at 25, 55, and 85 C for the retention time measurement. Figure 6(b) shows ln t as a function of thermal energy (1=kT ).…”
Section: Resultsmentioning
confidence: 99%