2009
DOI: 10.1103/physrevb.80.134514
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Temperature dependence of resistivity and Hall coefficient in strongly disordered NbN thin films

Abstract: We report the temperature dependence of resistivity ͑͒ and Hall coefficient ͑R H ͒ in the normal state of homogeneously disordered epitaxial NbN thin films with k F l ϳ 1.68-10.12. The superconducting transition temperature ͑T c ͒ of these films varies from 2.7 to 16.8 K. While our least disordered film displays usual metallic behavior, for all the films with k F l Յ 8.13, both d dT and dR H dT are negative up to 285 K. We observe that R H ͑T͒ varies linearly with ͑T͒ for all the films and ͓ R H ͑T͒−R H ͑285 K… Show more

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Cited by 44 publications
(33 citation statements)
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References 28 publications
(18 reference statements)
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“…is in the range of 0.5 − 0.7 near the Mott QCP, again in good qualitative accord with the value of 0.69 from Hall data [8]. In Panel (d), we show clear scaling of the experimentally extracted log(σ (c) xy /σxy(T )) in very good accord with theory for the same sample set used for Panel (a).…”
Section: −4supporting
confidence: 85%
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“…is in the range of 0.5 − 0.7 near the Mott QCP, again in good qualitative accord with the value of 0.69 from Hall data [8]. In Panel (d), we show clear scaling of the experimentally extracted log(σ (c) xy /σxy(T )) in very good accord with theory for the same sample set used for Panel (a).…”
Section: −4supporting
confidence: 85%
“…Recent work on NbN [8] most clearly reveals ill-understood signatures of localization incompatible with weak localization predictions. In NbN, the effect of intentional charge disorder is to cause a random variation in the local atomic potential, which increases as k F l is reduced by increasing the dis- , in excellent accord with theory [11].…”
Section: −4mentioning
confidence: 97%
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“…The shaded region corresponds to the BKT fluctuation regime dominated by interacting vortices. The samples used in our experiments were grown on lattice matched MgO substrate using RF magnetron sputtering (details refer [20,24,25]). Contacts (Cr/Au) were defined by wire masking for four-probe measurements.…”
mentioning
confidence: 99%