2023
DOI: 10.1016/j.nima.2022.167934
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Temperature dependence of radiation damage annealing of Silicon Photomultipliers

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Cited by 7 publications
(9 citation statements)
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“…Therefore, the Terzina telescope design has to consider possible shields, thermostats, and SiPM annealing strategies. A description of the temperature dependence of the radiation damage annealing of a SiPM can be found in [19].…”
Section: Discussionmentioning
confidence: 99%
“…Therefore, the Terzina telescope design has to consider possible shields, thermostats, and SiPM annealing strategies. A description of the temperature dependence of the radiation damage annealing of a SiPM can be found in [19].…”
Section: Discussionmentioning
confidence: 99%
“…Finally, SiPMs have been shown to degrade in space due to radiation damage [2]. Based on simulations we know that the low energy threshold will increase due to this by approximately 1 p.e.…”
Section: Pos(icrc2023)550mentioning
confidence: 99%
“…In order to mitigate this, we have also tested that the irradiation damage can be recuperated by bringing the SiPMs to a high temperature for a couple of hours. Heating to 60 • C using simple resistors is implemented and will be performed once per year for about 1 day in orbit [2]. It can be seen that POLAR-2 is significantly more sensitive at low energies thanks to the SiPM technology, Right: an exploded view of the POLAR-2 high energy polarimeter.…”
Section: Pos(icrc2023)550mentioning
confidence: 99%
“…This higher efficiency remains when convolving the emission spectrum of these scintillators, which both peak at 425 nm, with the photo-detection efficiency vs wavelength of the Silicon PhotoMultiplier (SiPM) which reads it out [19]. However, recent studies, which are discussed in detail in [19,22], indicate that, due to the smoother surface quality achievable for EJ-248M, the number of photons which reach the bottom of the scintillator is higher for EJ-248M, despite the difference in light yield. This effect was additionally verified during the tests described here by also irradiating a polarimeter module -5 -containing EJ-248M.…”
Section: Polarimeter Module: Mechanical Designmentioning
confidence: 99%