2009
DOI: 10.1016/j.tsf.2008.11.051
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Temperature dependence of photocapacitance spectrum of CIGS thin-film solar cell

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Cited by 34 publications
(19 citation statements)
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“…The large A and J 0 values observed from CGS solar cells are attributable to a larger carrier recombination probability than that for CIGS solar cells due to the absence of a Ga gradient that is believed to have the effect of repelling minority carriers (the so‐called back surface field effect). The presence of a deep defect level at 0.8 eV above the valence band maximum, which is independent of the [Ga]/[In] composition ratio in CIGS, has also been regarded to act as a possible recombination center for CGS solar cells . Nevertheless, CGS solar cell efficiencies exceeding 10% were demonstrated in this study.…”
Section: Resultsmentioning
confidence: 72%
“…The large A and J 0 values observed from CGS solar cells are attributable to a larger carrier recombination probability than that for CIGS solar cells due to the absence of a Ga gradient that is believed to have the effect of repelling minority carriers (the so‐called back surface field effect). The presence of a deep defect level at 0.8 eV above the valence band maximum, which is independent of the [Ga]/[In] composition ratio in CIGS, has also been regarded to act as a possible recombination center for CGS solar cells . Nevertheless, CGS solar cell efficiencies exceeding 10% were demonstrated in this study.…”
Section: Resultsmentioning
confidence: 72%
“…Existence of the deep-level defect around 0.8 eV above E v in CIGS has been reported previously. 30 It can be seen from the figure that intensity of the defect-signal is much higher in case of CZTS and CZTSSe-based solar cells. Urbach energy of E u $ 28 meV has been calculated for CIGS from band-tail region of the corresponding TPC signals.…”
mentioning
confidence: 88%
“…[13,14] The presence of point defects in the CIGSe absorber material might lead to the formation of recombination centers and limit the device efficiency. [28,29] In addition, deep-level transient spectroscopy probed at least two transition levels in the CIGSe absorber. Experimentally, point defects in CuInSe 2 (CISe), CuGaSe 2 (CGSe), and CIGSe have been studied using different techniques such as photoluminescence, [15][16][17][18][19][20][21] cathodoluminescence, [22][23][24] and optical absorption measurement.…”
Section: Introductionmentioning
confidence: 99%