Temperature dependence of ferromagnetic resonance in permalloy/NiO exchange-biased films

Dubowik, J.; Stobiecki, F.; Gościańska, I.; Lee, Y. P.; Paetzold, A.; Röll, K.

doi:10.1140/epjb/e2005-00174-7

Cited by 17 publications

(20 citation statements)

References 24 publications

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“…The parameters were set as follows: 0 = 1.5ϫ 10 −9 s and ␦ = 31 K. The impurities responsible for the slow-relaxer process are, therefore, well described in our study by paramagnetic atoms at the interface. One should note that it is in agreement with the results of Dubowik et al 9 obtained in a more restricted temperature region. As evoked by Safonov and Bertram, 16 their appearance could be explained by imperfections in fine grains consisting in either paramagnetic ions such as Mn 3+ , or surface magnetic atoms that behave like impurities.…”

Section: But Only When H E ӷ H Wsupporting

confidence: 92%

“…The slow-relaxer model has already been applied to NiFe/NiO and NiFe/CoO exchange-biased bilayers. [7][8][9] The observation of a peak in the thermal dependence of the linewidth by McMichael et al 7 and Lubitz et al 8 drove them to analyze the slow relaxation mechanism as the consequence of the thermal reversal of the antiferromagnetic grains and to consider the antiferromagnetic grains as the impurities coupled to the ferromagnet by exchange. This scenario was rejected by Dubowik et al 9 who considered paramagnetic Ni 2+ and Fe 2+ ions at the NiFe/ NiO interface as impurities responsible for the slow-relaxer process.…”

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confidence: 99%

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Dynamical effect in measurement of the exchange-bias field: A consequence of the slow-relaxer mechanism

et al. 2009

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We report on the temperature dependence of ferromagnetic resonance ͑FMR͒ measurements on NiFe/FeMn bilayer. This includes investigations about the angular distribution of the resonance, H R , and that of the linewidth, ⌬H. By considering the domain-wall formation model, the exchange-bias field, H EB,FMR , is derived from the FMR measurements. The disagreements observed at low temperature between these values and the ones obtained from superconducting quantum interference device measurements, H EB,SQUID , are discussed. We demonstrate that the negative line shift and the maximum of the linewidth of the FMR line are both perfectly interpreted through the slow-relaxer mechanism. This enabled us to elucidate the intriguing question about the yielding to different values of the exchange-bias anisotropy by both techniques.

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Section: But Only When H E ӷ H Wsupporting

confidence: 92%

mentioning

confidence: 99%

Dynamical effect in measurement of the exchange-bias field: A consequence of the slow-relaxer mechanism

et al. 2009

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“…Of the suggested models, this seems to give the best fit, supporting the theory of slow relaxation by paramagnetic ions as suggested by others. [13][14][15] This model is consistent with that used in Refs. 14 and 15.…”

Section: Aip Advances 8 056302 (2018)supporting

confidence: 89%

“…Others have suggested that the impurities are paramagnetic ions present at the interface of the ferromagnetic and antiferromagnetic layers. [13][14][15] In this work, the theory of paramagnetic ion relaxation is used to describe experimental observations. according to the number of layers to hold the total sample thickness constant.…”

Section: Introductionmentioning

confidence: 99%

Temperature dependence of exchange bias in (NiFe/IrMn)n multilayer films studied through static and dynamic techniques

et al. 2017

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The in-plane temperature dependence of exchange bias was studied through both dc magnetometry and ferromagnetic resonance spectroscopy in a series of [NiFe/IrMn]n multilayer films, where n is the number of layer repetitions. Major hysteresis loops were recorded in the temperature range of 300 K to 2 K to reveal the effect of temperature on the exchange bias in the static regime while temperature-dependent continuous-wave ferromagnetic resonance for frequencies from 3 to 16 GHz was used to determine the exchange bias dynamically. Strong divergence between the values of exchange bias determined using the two different types of measurements as well as a peak in temperature dependence of the resonance linewidth were observed. These results are explained in terms of the slow-relaxer mechanism.

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“…This model was also applied to NiFe/NiO and NiFe/CoO exchange-biased bilayers. [15][16][17] McMichael et al 15 as well as Lubitz et al 16 explained the peak observed in the thermal dependence of the linewidth, ⌬H, by the slow relaxer ͑SR͒ model: they, indeed, considered the antiferromagnetic grains as the impurities coupled to the ferromagnet by exchange. On the other hand, this scenario was rejected by Dubowik et al, 17 who proposed that paramagnetic Ni 2+ and Fe 2+ ions at the NiFe/ NiO interface act as impurities.…”

Section: Introductionmentioning

confidence: 99%

Temperature dependence of exchange bias in NiFe/FeMn bilayers

et al. 2010

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Ferromagnetic resonance ͑FMR͒ and dc-magnetometry measurements were used to investigate the temperature dependence of the anisotropies responsible for the exchange-bias coupling in NiFe/FeMn bilayer. At room temperature, both measurements showed the same exchange-bias angular distributions due to a low coupling strength, H E , with respect to the antiferromagnet domain-wall formation anisotropy. The anisotropies derived from both techniques displayed identical H E values but different uniaxial anisotropies. This disagreement may be ascribed to different stabilities of antiferromagnetic grains in both techniques. At low temperature, strong disagreements were found on the exchange-bias values. They are explained by the occurrence of the slow relaxer mechanism in FMR experiments.

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Temperature dependence of ferromagnetic resonance in permalloy/NiO exchange-biased films

Cited by 17 publications

References 24 publications

Dynamical effect in measurement of the exchange-bias field: A consequence of the slow-relaxer mechanism

Dynamical effect in measurement of the exchange-bias field: A consequence of the slow-relaxer mechanism

Temperature dependence of exchange bias in (NiFe/IrMn)n multilayer films studied through static and dynamic techniques

Temperature dependence of exchange bias in NiFe/FeMn bilayers

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