2008
DOI: 10.1088/1367-2630/10/10/103029
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Temperature dependence of absorption band edge of CdTe nanocrystals in glass

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Cited by 17 publications
(14 citation statements)
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“…The data from this low-nanocrystal-concentration region of the dried drop are consistent with a temperature increase of at most 10 K above room temperature [41,42]. This is in fact the maximal expected thermal effect of a focused laser for the powers and spot size used in our experiments, given dissipation through contact with the Si 3 N 4 substrate which we suppose remains at room temperature for regions more than 5 μm away from the laser spot.…”
Section: Resultssupporting
confidence: 83%
“…The data from this low-nanocrystal-concentration region of the dried drop are consistent with a temperature increase of at most 10 K above room temperature [41,42]. This is in fact the maximal expected thermal effect of a focused laser for the powers and spot size used in our experiments, given dissipation through contact with the Si 3 N 4 substrate which we suppose remains at room temperature for regions more than 5 μm away from the laser spot.…”
Section: Resultssupporting
confidence: 83%
“…It is known that the temperature dependence of the energy gap of bulk semiconductor crystals is described by the empirical Varshni equation: Eg=EoαT2T+θwhere E 0 is the energy gap at 0 K, θ is the Debye temperature (for bulk CdTe θ = 160 K) and α is the temperature sensitivity. In previous studies , the Varshni equation has been used to describe the temperature dependence of the energy gap of QDs. We assume that the energy dependence of the PL of semiconductor nanoparticles has a similar relationship, and therefore the temperature sensitivity of QDs of certain size can be determined from the slope of the linear approximation plotted in the coordinates E PL vs αT 2 /( T + θ).…”
Section: Resultsmentioning
confidence: 99%
“…In Allahverdi et al , the difference between the sensitivity of bulk and nanosized semiconductor crystals is explained in terms of the influence of quantum confinement, a change in the electron–phonon interaction, and the influence of thermal strain. Thus, the temperature sensitivity of the nanoscale crystal ( α nano ) can be expressed as: αitalicnano=αitalicbulk+2kBSitalicnanoSitalicbulk+h2π2μRitalicave2β+EgP3B0βH2Oβwhere α bulk is the temperature coefficient of bulk semiconductor, S nano , S bulk is the Huang–Rhys factors for nanoscale and bulk semiconductor respectively, k B is the Boltzmann constant, R ave is the average radius of nanoparticles, μ is the reduced mass of the electron and hole, h is the Planck's constant, β is the average temperature expansion coefficient of nanocrystals, ()EgP is a change in the energy gap due to changes in lattice pressure, B 0 is the bulk modulus and βH2O is the coefficient of thermal expansion of the environment (which is water in our case).…”
Section: Resultsmentioning
confidence: 99%
“…Strain, due to dangling bonds at the interfaces and surfaces, and quantum size effects, due to the charge confinement in the nanometer‐scale structure of films, might both lead to this redshift in the bandgap energy ( E R ) of the film. The average radii or grain sizes ( R ave ) are evaluated by using size‐dependent bandgap energy of the film ( E R ) : ERtrue(eVtrue)=Egtrue(eVtrue)0.14Ravetrue(nmtrue)+0.376μ[Rave(normalnnormalm)]2+ΔEstrain, where E g is the bandgap energy of the bulk and it is given by the value E g = 1.44 eV , μ is the reduced mass of an electron–hole pair in units of electron rest mass ( m 0 ) , and it is given by μ = 0.08 (in m 0 units) . Δ E strain is the energy due to the strain and it was estimated at about 2.2% of the 710 meV total redshift that takes place in the absorption edge energy with increasing film thickness from 100 to 500 nm.…”
Section: Modelingmentioning
confidence: 99%
“…where E g is the bandgap energy of the bulk and it is given by the value E g ¼ 1.44 eV [30], m is the reduced mass of an electronhole pair in units of electron rest mass (m 0 ) [31], and it is given by m¼ 0.08 (in m 0 units) [32]. DE strain is the energy due to the strain and it was estimated at about 2.2% of the 710 meV total redshift that takes place in the absorption edge energy with increasing film thickness from 100 to 500 nm.…”
mentioning
confidence: 99%